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contributor authorD. V. Caletka
contributor authorR. N. Caldwell
contributor authorJ. T. Vogelmann
date accessioned2017-05-08T23:32:22Z
date available2017-05-08T23:32:22Z
date copyrightSeptember, 1990
date issued1990
identifier issn1528-9044
identifier otherJEPAE4-26117#198_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106759
description abstractAs the mechanical, thermal, and electrical demands on 2nd and 3rd level electronic packages increase, so does the need for early dynamic analysis of the proposed design. Estimating effect of dynamic transients (shock inputs) is of primary concern and the current topic of discussion. The computational determination of a damage boundary curve/s (DBC) for a proposed 2nd/3rd level package may seem a formidable task. With the experienced use of the finite element method (FEM), engineering insight, and some relatively simple mechanical testing, the task can be reasonably accomplished. This is not to say that every failure mechanism can be foreseen, predicted or modeled, but some failures can be avoided during qualification testing. The proposed method of DBC determination requires some initial ideas related to where failures may occur due to transient inputs. Failures may include a given maximum stress level, strain, deflection of a particular point or the force at a riveted connection. These suspect areas of failure will tend to guide the modeling technique. Models must be constructed not only to address the specific areas of concern but also to reasonably represent the overall dynamics of the package. Examples of this technique will be presented, each with varying degrees of verification.
publisherThe American Society of Mechanical Engineers (ASME)
titleDamage Boundary Curves: A Computational (FEM) Approach
typeJournal Paper
journal volume112
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2904367
journal fristpage198
journal lastpage203
identifier eissn1043-7398
keywordsFinite element methods
keywordsFinite element model
keywordsFailure
keywordsMechanical testing
keywordsElectronic packages
keywordsDynamics (Mechanics)
keywordsForce
keywordsStress
keywordsShock (Mechanics)
keywordsDesign
keywordsDynamic analysis
keywordsFailure mechanisms
keywordsModeling
keywordsTesting AND Deflection
treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 003
contenttypeFulltext


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