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    Observations on the Mechanisms of Fatigue in Eutectic Pb-Sn Solder Joints

    Source: Journal of Electronic Packaging:;1989:;volume( 111 ):;issue: 002::page 83
    Author:
    D. Tribula
    ,
    D. Grivas
    ,
    D. R. Frear
    ,
    J. W. Morris
    DOI: 10.1115/1.3226526
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Near-eutectic Pb-Sn solders are widely used for joints in electrical devices. These are liable to failure by thermal fatigue during operation of the device. Since the thermal fatigue load is often in shear, mechanisms of thermal fatigue in shear are of particular interest. Recent research has shown that the thermal fatigue of eutectic solders in shear is preceded by the formation of bands of coarsened material in the eutectic microstructure, which concentrate the deformation and cause the nucleation of fatigue cracks. Such coarsened bands are also observed in isothermal fatigue and unidirectional creep in shear. Since creep experiments are relatively simple to conduct and analyze, these have been used to study the formation and growth of coarsened bands. The mechanism includes three steps: the formation of inhomogeneous shear bands, the onset of recrystallization in the shear band to create a planar region of coarsened material, and the propagation of the coarsened band by progressive recrystallization at its tip. The results are applied to thermal fatigue and some of their implications are discussed.
    keyword(s): Fatigue , Solder joints , Mechanisms , Shear (Mechanics) , Solders , Recrystallization , Creep , Deformation , Stress , Nucleation (Physics) , Failure AND Fatigue cracks ,
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      Observations on the Mechanisms of Fatigue in Eutectic Pb-Sn Solder Joints

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    http://yetl.yabesh.ir/yetl1/handle/yetl/105253
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    contributor authorD. Tribula
    contributor authorD. Grivas
    contributor authorD. R. Frear
    contributor authorJ. W. Morris
    date accessioned2017-05-08T23:29:44Z
    date available2017-05-08T23:29:44Z
    date copyrightJune, 1989
    date issued1989
    identifier issn1528-9044
    identifier otherJEPAE4-26108#83_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/105253
    description abstractNear-eutectic Pb-Sn solders are widely used for joints in electrical devices. These are liable to failure by thermal fatigue during operation of the device. Since the thermal fatigue load is often in shear, mechanisms of thermal fatigue in shear are of particular interest. Recent research has shown that the thermal fatigue of eutectic solders in shear is preceded by the formation of bands of coarsened material in the eutectic microstructure, which concentrate the deformation and cause the nucleation of fatigue cracks. Such coarsened bands are also observed in isothermal fatigue and unidirectional creep in shear. Since creep experiments are relatively simple to conduct and analyze, these have been used to study the formation and growth of coarsened bands. The mechanism includes three steps: the formation of inhomogeneous shear bands, the onset of recrystallization in the shear band to create a planar region of coarsened material, and the propagation of the coarsened band by progressive recrystallization at its tip. The results are applied to thermal fatigue and some of their implications are discussed.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleObservations on the Mechanisms of Fatigue in Eutectic Pb-Sn Solder Joints
    typeJournal Paper
    journal volume111
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.3226526
    journal fristpage83
    journal lastpage89
    identifier eissn1043-7398
    keywordsFatigue
    keywordsSolder joints
    keywordsMechanisms
    keywordsShear (Mechanics)
    keywordsSolders
    keywordsRecrystallization
    keywordsCreep
    keywordsDeformation
    keywordsStress
    keywordsNucleation (Physics)
    keywordsFailure AND Fatigue cracks
    treeJournal of Electronic Packaging:;1989:;volume( 111 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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