Show simple item record

contributor authorD. Tribula
contributor authorD. Grivas
contributor authorD. R. Frear
contributor authorJ. W. Morris
date accessioned2017-05-08T23:29:44Z
date available2017-05-08T23:29:44Z
date copyrightJune, 1989
date issued1989
identifier issn1528-9044
identifier otherJEPAE4-26108#83_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/105253
description abstractNear-eutectic Pb-Sn solders are widely used for joints in electrical devices. These are liable to failure by thermal fatigue during operation of the device. Since the thermal fatigue load is often in shear, mechanisms of thermal fatigue in shear are of particular interest. Recent research has shown that the thermal fatigue of eutectic solders in shear is preceded by the formation of bands of coarsened material in the eutectic microstructure, which concentrate the deformation and cause the nucleation of fatigue cracks. Such coarsened bands are also observed in isothermal fatigue and unidirectional creep in shear. Since creep experiments are relatively simple to conduct and analyze, these have been used to study the formation and growth of coarsened bands. The mechanism includes three steps: the formation of inhomogeneous shear bands, the onset of recrystallization in the shear band to create a planar region of coarsened material, and the propagation of the coarsened band by progressive recrystallization at its tip. The results are applied to thermal fatigue and some of their implications are discussed.
publisherThe American Society of Mechanical Engineers (ASME)
titleObservations on the Mechanisms of Fatigue in Eutectic Pb-Sn Solder Joints
typeJournal Paper
journal volume111
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.3226526
journal fristpage83
journal lastpage89
identifier eissn1043-7398
keywordsFatigue
keywordsSolder joints
keywordsMechanisms
keywordsShear (Mechanics)
keywordsSolders
keywordsRecrystallization
keywordsCreep
keywordsDeformation
keywordsStress
keywordsNucleation (Physics)
keywordsFailure AND Fatigue cracks
treeJournal of Electronic Packaging:;1989:;volume( 111 ):;issue: 002
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record