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    Scalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques

    Source: Journal of Micro and Nano-Manufacturing:;2024:;volume( 011 ):;issue: 001::page 11005-1
    Author:
    Hrdy, Mark
    ,
    Mallavarapu, Akhila
    ,
    Castañeda, Mariana
    ,
    Ajay, Paras
    ,
    Sreenivasan, S. V.
    DOI: 10.1115/1.4064611
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au nanopatterning involves the use of liftoff processes which have poor yield in manufacturing settings. We report a technique that takes advantage of adhesive forces during MacEtch to mechanically break the metal catalyst over a patterned resist. Three methods for generating increased uniformity are demonstrated—(i), (ii), (iii). Using these methods, taper-free 100 nm nanopillars are presented with wafer-scale uniformity using techniques that can be readily implemented for scalable nanomanufacturing.
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      Scalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4303345
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    contributor authorHrdy, Mark
    contributor authorMallavarapu, Akhila
    contributor authorCastañeda, Mariana
    contributor authorAjay, Paras
    contributor authorSreenivasan, S. V.
    date accessioned2024-12-24T19:08:03Z
    date available2024-12-24T19:08:03Z
    date copyright2/15/2024 12:00:00 AM
    date issued2024
    identifier issn2166-0468
    identifier otherjmnm_011_01_011005.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4303345
    description abstractThis paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au nanopatterning involves the use of liftoff processes which have poor yield in manufacturing settings. We report a technique that takes advantage of adhesive forces during MacEtch to mechanically break the metal catalyst over a patterned resist. Three methods for generating increased uniformity are demonstrated—(i), (ii), (iii). Using these methods, taper-free 100 nm nanopillars are presented with wafer-scale uniformity using techniques that can be readily implemented for scalable nanomanufacturing.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleScalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques
    typeJournal Paper
    journal volume11
    journal issue1
    journal titleJournal of Micro and Nano-Manufacturing
    identifier doi10.1115/1.4064611
    journal fristpage11005-1
    journal lastpage11005-7
    page7
    treeJournal of Micro and Nano-Manufacturing:;2024:;volume( 011 ):;issue: 001
    contenttypeFulltext
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