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contributor authorHrdy, Mark
contributor authorMallavarapu, Akhila
contributor authorCastañeda, Mariana
contributor authorAjay, Paras
contributor authorSreenivasan, S. V.
date accessioned2024-12-24T19:08:03Z
date available2024-12-24T19:08:03Z
date copyright2/15/2024 12:00:00 AM
date issued2024
identifier issn2166-0468
identifier otherjmnm_011_01_011005.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4303345
description abstractThis paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au nanopatterning involves the use of liftoff processes which have poor yield in manufacturing settings. We report a technique that takes advantage of adhesive forces during MacEtch to mechanically break the metal catalyst over a patterned resist. Three methods for generating increased uniformity are demonstrated—(i), (ii), (iii). Using these methods, taper-free 100 nm nanopillars are presented with wafer-scale uniformity using techniques that can be readily implemented for scalable nanomanufacturing.
publisherThe American Society of Mechanical Engineers (ASME)
titleScalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques
typeJournal Paper
journal volume11
journal issue1
journal titleJournal of Micro and Nano-Manufacturing
identifier doi10.1115/1.4064611
journal fristpage11005-1
journal lastpage11005-7
page7
treeJournal of Micro and Nano-Manufacturing:;2024:;volume( 011 ):;issue: 001
contenttypeFulltext


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