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    Development of a Thermal Metrology Standard for Evaluation of Cold Plate Thermal Resistance as a Performance Metric

    Source: Journal of Electronic Packaging:;2024:;volume( 146 ):;issue: 004::page 41118-1
    Author:
    Martinez, Victor A.
    ,
    Caceres, Carol
    ,
    Ortega, Alfonso
    DOI: 10.1115/1.4066101
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A significant number of investigations have been performed to develop and optimize cold plates for direct-to-chip cooling of processor packages. Many investigations have reported computational simulations using commercially available computational fluid dynamic tools that are compared to experimental data. Generally, the simulations and experimental data are in qualitative agreement but often not in quantitative agreement. Frequently, the experimental characterizations have high experimental uncertainty. In this study, extensive experimental evaluations are used to demonstrate the errors in experimental thermal measurements and the experimental artifacts during testing that lead to unacceptable inconsistency and uncertainty in the reported thermal resistance. By comparing experimental thermal data, such as the temperature at multiple positions on the processor lid, and using that data to extract a meaningful measure of thermal resistance, it is shown that the data uncertainty and inconsistency are primarily due to three factors: (1) inconsistency in the thermal boundary condition supplied by the thermal test vehicle (TTV) to the cold plate, (2) errors in the measurement and interpretation of the surface temperature of a solid surface, such as the heated lid surface, and (3) errors introduced by improper contact between cold plate and TTV. A standard thermal test vehicle (STTV) was engineered and used to provide reproducible thermal boundary conditions to the cold plate. An uncertainty analysis was performed in order to discriminate between the sources of inconsistencies in the reporting of thermal resistance, including parameters such as mechanical load distribution, methods for measuring the cold plate base, and TTV surface temperatures. A critical analysis of the classical thermal resistance definition was performed to emphasize its shortcomings for evaluating the performance of a cold plate. It is shown that the thermal resistance of cold plates based on heat exchanger theory better captures the physics of the heat transfer process when cold plates operate at high thermodynamic effectiveness.
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      Development of a Thermal Metrology Standard for Evaluation of Cold Plate Thermal Resistance as a Performance Metric

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4302854
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    contributor authorMartinez, Victor A.
    contributor authorCaceres, Carol
    contributor authorOrtega, Alfonso
    date accessioned2024-12-24T18:50:42Z
    date available2024-12-24T18:50:42Z
    date copyright8/24/2024 12:00:00 AM
    date issued2024
    identifier issn1043-7398
    identifier otherep_146_04_041118.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4302854
    description abstractA significant number of investigations have been performed to develop and optimize cold plates for direct-to-chip cooling of processor packages. Many investigations have reported computational simulations using commercially available computational fluid dynamic tools that are compared to experimental data. Generally, the simulations and experimental data are in qualitative agreement but often not in quantitative agreement. Frequently, the experimental characterizations have high experimental uncertainty. In this study, extensive experimental evaluations are used to demonstrate the errors in experimental thermal measurements and the experimental artifacts during testing that lead to unacceptable inconsistency and uncertainty in the reported thermal resistance. By comparing experimental thermal data, such as the temperature at multiple positions on the processor lid, and using that data to extract a meaningful measure of thermal resistance, it is shown that the data uncertainty and inconsistency are primarily due to three factors: (1) inconsistency in the thermal boundary condition supplied by the thermal test vehicle (TTV) to the cold plate, (2) errors in the measurement and interpretation of the surface temperature of a solid surface, such as the heated lid surface, and (3) errors introduced by improper contact between cold plate and TTV. A standard thermal test vehicle (STTV) was engineered and used to provide reproducible thermal boundary conditions to the cold plate. An uncertainty analysis was performed in order to discriminate between the sources of inconsistencies in the reporting of thermal resistance, including parameters such as mechanical load distribution, methods for measuring the cold plate base, and TTV surface temperatures. A critical analysis of the classical thermal resistance definition was performed to emphasize its shortcomings for evaluating the performance of a cold plate. It is shown that the thermal resistance of cold plates based on heat exchanger theory better captures the physics of the heat transfer process when cold plates operate at high thermodynamic effectiveness.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDevelopment of a Thermal Metrology Standard for Evaluation of Cold Plate Thermal Resistance as a Performance Metric
    typeJournal Paper
    journal volume146
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4066101
    journal fristpage41118-1
    journal lastpage41118-9
    page9
    treeJournal of Electronic Packaging:;2024:;volume( 146 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian