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    Module-Level Thermal Interface Material Degradation in HALT

    Source: Journal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001::page 11106-1
    Author:
    Tompkins, Joshua
    ,
    Garcia, Alicia Medina
    ,
    Huitink, David
    ,
    Liao, Haitao
    DOI: 10.1115/1.4056030
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this study, thermal interface material (TIM) degradation is driven through highly accelerated life test (HALT) using temperature cycling with a prescribed vibrational acceleration for two commercially available materials having thermal conductivities of 6.0 and 8.5 W/m K. HALT specimens were prepared by applying TIM through a 4-mil stencil over AlSiC baseplates in the shape of those used in Wolfspeed CAS325M12HM2 power electronics modules. Baseplates were mounted onto aluminum carrier blocks with embedded thermocouples to characterize the thermal resistance across the baseplate and TIM layer. Thermal dissipation into the top of the baseplates was provided by a custom heating block, which mimics the size and placement of the die junctions in CAS325 modules, applying power loads of 200, 300, and 400 W. After initial characterization, samples were transferred to the HALT chamber with one set of samples exposed to temperature cycling only (TCO) and the other temperature cycling and vibration (TCV). Both sample sets were cycled between temperature extremes of −40 °C and 180 °C with vibrations applied at a peak acceleration of 3.21 Grms. After hundreds of cycles, samples were reevaluated to assess changes in thermal resistance to provide an accelerated measure of TIM degradation. This allows for reliability prediction of useful lifetime (illustrated in a solar inverter case study herein), as well as to provide a basis for developing an accelerated testing method to related temperature cycling to faster methods of degradation. Such techniques provide a means to develop maintenance schedules for power modules for ensuring sufficient thermal performance over the operating lifetime.
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      Module-Level Thermal Interface Material Degradation in HALT

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4291697
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    contributor authorTompkins, Joshua
    contributor authorGarcia, Alicia Medina
    contributor authorHuitink, David
    contributor authorLiao, Haitao
    date accessioned2023-08-16T18:14:46Z
    date available2023-08-16T18:14:46Z
    date copyright11/23/2022 12:00:00 AM
    date issued2022
    identifier issn1043-7398
    identifier otherep_145_01_011106.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4291697
    description abstractIn this study, thermal interface material (TIM) degradation is driven through highly accelerated life test (HALT) using temperature cycling with a prescribed vibrational acceleration for two commercially available materials having thermal conductivities of 6.0 and 8.5 W/m K. HALT specimens were prepared by applying TIM through a 4-mil stencil over AlSiC baseplates in the shape of those used in Wolfspeed CAS325M12HM2 power electronics modules. Baseplates were mounted onto aluminum carrier blocks with embedded thermocouples to characterize the thermal resistance across the baseplate and TIM layer. Thermal dissipation into the top of the baseplates was provided by a custom heating block, which mimics the size and placement of the die junctions in CAS325 modules, applying power loads of 200, 300, and 400 W. After initial characterization, samples were transferred to the HALT chamber with one set of samples exposed to temperature cycling only (TCO) and the other temperature cycling and vibration (TCV). Both sample sets were cycled between temperature extremes of −40 °C and 180 °C with vibrations applied at a peak acceleration of 3.21 Grms. After hundreds of cycles, samples were reevaluated to assess changes in thermal resistance to provide an accelerated measure of TIM degradation. This allows for reliability prediction of useful lifetime (illustrated in a solar inverter case study herein), as well as to provide a basis for developing an accelerated testing method to related temperature cycling to faster methods of degradation. Such techniques provide a means to develop maintenance schedules for power modules for ensuring sufficient thermal performance over the operating lifetime.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleModule-Level Thermal Interface Material Degradation in HALT
    typeJournal Paper
    journal volume145
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4056030
    journal fristpage11106-1
    journal lastpage11106-9
    page9
    treeJournal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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