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    High Strain Rate Mechanical Properties of SAC-Q With Sustained Elevated Temperature Storage at 100 °C

    Source: Journal of Electronic Packaging:;2020:;volume( 142 ):;issue: 004::page 041104-1
    Author:
    Lall, Pradeep
    ,
    Mehta, Vishal
    ,
    Suhling, Jeff
    ,
    Locker, David
    DOI: 10.1115/1.4047392
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Leadfree electronics in harsh environments often may be exposed to elevated temperature for the duration of storage, transport, and usage in addition to high strain rate triggering loads during drop-impact, vibration, and shock. These electronic components may get exposed to high strain rates of 1 to 100 s−1 and operating temperatures up to 200 °C in critical surroundings. Doped SAC solder alloys such as SAC-Q are being considered for use in fine-pitch electronic components. SAC-Q consists of Sn-Ag-Cu alloy in addition to Bi (SAC+Bi). Prior data presented to date for lead-free solders, such as SAC-Q alloy, at high aging temperature and high strain rate are for 50 °C sustained exposure. In this paper, the effect of sustained exposure to temperature of 100 °C on high strain rate properties of SAC-Q is studied. Thermally aged SAC-Q samples at 100 °C have been tested at a range of strain rates including 10, 35, 50, and 75 s−1 and operating temperatures ranging from 25 °C up to 200 °C. Stress–strain curves are established for the given range of strain rates and operating temperatures. Also, the computed experimental results and data have been fitted to the Anand viscoplasticity model for SAC-Q for comparison.
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      High Strain Rate Mechanical Properties of SAC-Q With Sustained Elevated Temperature Storage at 100 °C

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    contributor authorLall, Pradeep
    contributor authorMehta, Vishal
    contributor authorSuhling, Jeff
    contributor authorLocker, David
    date accessioned2022-02-04T21:56:56Z
    date available2022-02-04T21:56:56Z
    date copyright6/23/2020 12:00:00 AM
    date issued2020
    identifier issn1043-7398
    identifier otherep_142_04_041104.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4274584
    description abstractLeadfree electronics in harsh environments often may be exposed to elevated temperature for the duration of storage, transport, and usage in addition to high strain rate triggering loads during drop-impact, vibration, and shock. These electronic components may get exposed to high strain rates of 1 to 100 s−1 and operating temperatures up to 200 °C in critical surroundings. Doped SAC solder alloys such as SAC-Q are being considered for use in fine-pitch electronic components. SAC-Q consists of Sn-Ag-Cu alloy in addition to Bi (SAC+Bi). Prior data presented to date for lead-free solders, such as SAC-Q alloy, at high aging temperature and high strain rate are for 50 °C sustained exposure. In this paper, the effect of sustained exposure to temperature of 100 °C on high strain rate properties of SAC-Q is studied. Thermally aged SAC-Q samples at 100 °C have been tested at a range of strain rates including 10, 35, 50, and 75 s−1 and operating temperatures ranging from 25 °C up to 200 °C. Stress–strain curves are established for the given range of strain rates and operating temperatures. Also, the computed experimental results and data have been fitted to the Anand viscoplasticity model for SAC-Q for comparison.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleHigh Strain Rate Mechanical Properties of SAC-Q With Sustained Elevated Temperature Storage at 100 °C
    typeJournal Paper
    journal volume142
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4047392
    journal fristpage041104-1
    journal lastpage041104-12
    page12
    treeJournal of Electronic Packaging:;2020:;volume( 142 ):;issue: 004
    contenttypeFulltext
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