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    Structural Design of Land Grid Array Loading Mechanisms for Intel Central Processor Unit Stack Retention

    Source: Journal of Electronic Packaging:;2019:;volume( 141 ):;issue: 001::page 10801
    Author:
    Geng, Phil
    DOI: 10.1115/1.4042800
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: For more than a decade, land grid array (LGA) has been one of the main central processor unit (CPU) packages developed at Intel and AMD, and widely used in different computer systems. LGA loading mechanism has become more critical to achieve mechanical, thermal, and electrical functions with the increasing retention force requirement. During the development of the loading mechanisms for LGA packages and sockets, socket pin contact to LGA pad under retention load, solder joint reliability under shock load, socket pin fretting under vibration, and load degradation are some of the key structural risks. This paper reviews the structural designs of different loading mechanism solutions systematically and summarizes the key structural concerns and advantages. While the finite element analysis (FEA) was used to guide the design options in early platform architectural definition, this review discusses the evolution of Xeon LGA loading mechanisms developed at the Intel Data Center Group.
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      Structural Design of Land Grid Array Loading Mechanisms for Intel Central Processor Unit Stack Retention

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    contributor authorGeng, Phil
    date accessioned2019-03-17T10:10:19Z
    date available2019-03-17T10:10:19Z
    date copyright2/25/2019 12:00:00 AM
    date issued2019
    identifier issn1043-7398
    identifier otherep_141_01_010801.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4255965
    description abstractFor more than a decade, land grid array (LGA) has been one of the main central processor unit (CPU) packages developed at Intel and AMD, and widely used in different computer systems. LGA loading mechanism has become more critical to achieve mechanical, thermal, and electrical functions with the increasing retention force requirement. During the development of the loading mechanisms for LGA packages and sockets, socket pin contact to LGA pad under retention load, solder joint reliability under shock load, socket pin fretting under vibration, and load degradation are some of the key structural risks. This paper reviews the structural designs of different loading mechanism solutions systematically and summarizes the key structural concerns and advantages. While the finite element analysis (FEA) was used to guide the design options in early platform architectural definition, this review discusses the evolution of Xeon LGA loading mechanisms developed at the Intel Data Center Group.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleStructural Design of Land Grid Array Loading Mechanisms for Intel Central Processor Unit Stack Retention
    typeJournal Paper
    journal volume141
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4042800
    journal fristpage10801
    journal lastpage010801-8
    treeJournal of Electronic Packaging:;2019:;volume( 141 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian