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    Error Reduction in Infrared Thermography by Multiframe Super-Resolution

    Source: Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004::page 41008
    Author:
    Chandramohan, Aditya
    ,
    Lyons, Sara K.
    ,
    Weibel, Justin A.
    ,
    Garimella, Suresh V.
    DOI: 10.1115/1.4041360
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Accurate temperature measurement techniques are critical for monitoring hotspots that induce thermal stresses in electronics packages. Infrared thermography is a popular nonintrusive method for emissivity mapping and measuring surface temperature distribution, but is often impeded by the low native resolution of the camera. A promising technique to mitigate these resolution limits is multiframe super-resolution, which uses multiple subpixel shifted images to generate a single high-resolution image. This study quantifies the error reduction offered by multiframe super-resolution to demonstrate the potential improvement for infrared imaging applications. The multiframe super-resolution reconstruction is implemented using an algorithm developed to interpolate the sub-pixel-shifted low-resolution images to a higher resolution grid. Experimental multiframe super-resolution temperature maps of an electronic component are measured to demonstrate the improvement in feature capture and reduction in aliasing effects. Furthermore, emissivity mapping of the component surface is conducted and demonstrates a dramatic improvement in the temperature correction by multiframe super-resolution. A sensitivity analysis is conducted to assess the effect of registration uncertainty on the multiframe super-resolution algorithm; simulated images are used to demonstrate the smoothing effect at sharp emissivity boundaries as well as improvement in the feature size capture based on the native camera resolution. These results show that, within the limitations of the technique, multiframe super-resolution can be an effective approach for improving the accuracy of emissivity-mapped temperature measurements.
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      Error Reduction in Infrared Thermography by Multiframe Super-Resolution

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    contributor authorChandramohan, Aditya
    contributor authorLyons, Sara K.
    contributor authorWeibel, Justin A.
    contributor authorGarimella, Suresh V.
    date accessioned2019-02-28T11:14:10Z
    date available2019-02-28T11:14:10Z
    date copyright10/1/2018 12:00:00 AM
    date issued2018
    identifier issn1043-7398
    identifier otherep_140_04_041008.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4254143
    description abstractAccurate temperature measurement techniques are critical for monitoring hotspots that induce thermal stresses in electronics packages. Infrared thermography is a popular nonintrusive method for emissivity mapping and measuring surface temperature distribution, but is often impeded by the low native resolution of the camera. A promising technique to mitigate these resolution limits is multiframe super-resolution, which uses multiple subpixel shifted images to generate a single high-resolution image. This study quantifies the error reduction offered by multiframe super-resolution to demonstrate the potential improvement for infrared imaging applications. The multiframe super-resolution reconstruction is implemented using an algorithm developed to interpolate the sub-pixel-shifted low-resolution images to a higher resolution grid. Experimental multiframe super-resolution temperature maps of an electronic component are measured to demonstrate the improvement in feature capture and reduction in aliasing effects. Furthermore, emissivity mapping of the component surface is conducted and demonstrates a dramatic improvement in the temperature correction by multiframe super-resolution. A sensitivity analysis is conducted to assess the effect of registration uncertainty on the multiframe super-resolution algorithm; simulated images are used to demonstrate the smoothing effect at sharp emissivity boundaries as well as improvement in the feature size capture based on the native camera resolution. These results show that, within the limitations of the technique, multiframe super-resolution can be an effective approach for improving the accuracy of emissivity-mapped temperature measurements.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleError Reduction in Infrared Thermography by Multiframe Super-Resolution
    typeJournal Paper
    journal volume140
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4041360
    journal fristpage41008
    journal lastpage041008-8
    treeJournal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian