contributor author | Chen, Min | |
contributor author | Gao, Junling | |
contributor author | Kang, Zhengdong | |
contributor author | Zhang, Jianzhong | |
date accessioned | 2017-05-09T01:33:28Z | |
date available | 2017-05-09T01:33:28Z | |
date issued | 2016 | |
identifier issn | 1948-5085 | |
identifier other | tsea_008_04_044502.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/162585 | |
description abstract | The main objective of this study is to numerically analyze the uncertainty of the electrical interface resistance in thermoelectric modules (TEMs) and its contribution to the error of practical device and system simulation. To improve the simulation, the numerical implementation of the interface resistance in TEMs of any size, especially its temperaturedependent characteristics, is critical in the thermoelectric modeling. Using the electrothermal analogy and the PSpice simulator as the simulation baseline, the proposed nonlinear and statistical modeling of the interface resistance is examined and supported through extensive comparisons between experimental findings and numerical results. Considerable accuracy improvement is obtained for a single TEM and a system consisting of a number of interconnected TEMs. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Accuracy Enhancement of Thermoelectric Simulation by Modeling the Electrical Contact | |
type | Journal Paper | |
journal volume | 8 | |
journal issue | 4 | |
journal title | Journal of Thermal Science and Engineering Applications | |
identifier doi | 10.1115/1.4033881 | |
journal fristpage | 44502 | |
journal lastpage | 44502 | |
identifier eissn | 1948-5093 | |
tree | Journal of Thermal Science and Engineering Applications:;2016:;volume( 008 ):;issue: 004 | |
contenttype | Fulltext | |