Show simple item record

contributor authorChen, Min
contributor authorGao, Junling
contributor authorKang, Zhengdong
contributor authorZhang, Jianzhong
date accessioned2017-05-09T01:33:28Z
date available2017-05-09T01:33:28Z
date issued2016
identifier issn1948-5085
identifier othertsea_008_04_044502.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/162585
description abstractThe main objective of this study is to numerically analyze the uncertainty of the electrical interface resistance in thermoelectric modules (TEMs) and its contribution to the error of practical device and system simulation. To improve the simulation, the numerical implementation of the interface resistance in TEMs of any size, especially its temperaturedependent characteristics, is critical in the thermoelectric modeling. Using the electrothermal analogy and the PSpice simulator as the simulation baseline, the proposed nonlinear and statistical modeling of the interface resistance is examined and supported through extensive comparisons between experimental findings and numerical results. Considerable accuracy improvement is obtained for a single TEM and a system consisting of a number of interconnected TEMs.
publisherThe American Society of Mechanical Engineers (ASME)
titleAccuracy Enhancement of Thermoelectric Simulation by Modeling the Electrical Contact
typeJournal Paper
journal volume8
journal issue4
journal titleJournal of Thermal Science and Engineering Applications
identifier doi10.1115/1.4033881
journal fristpage44502
journal lastpage44502
identifier eissn1948-5093
treeJournal of Thermal Science and Engineering Applications:;2016:;volume( 008 ):;issue: 004
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record