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    Comparison of Electronic Component Durability Under Uniaxial and Multiaxial Random Vibrations

    Source: Journal of Electronic Packaging:;2015:;volume( 137 ):;issue: 001::page 11009
    Author:
    Ernst, Matthew
    ,
    Habtour, Ed
    ,
    Dasgupta, Abhijit
    ,
    Pohland, Michael
    ,
    Robeson, Mark
    ,
    Paulus, Mark
    DOI: 10.1115/1.4028516
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Multiaxial and uniaxial vibration experiments were conducted in order to study the differences in failure modes and fatigue life for the two types of excitation. An electrodynamic (ED) shaker capable of controlled vibration in six degrees of freedom (DOF) was employed for the experiments. The test specimen consisted of six large inductors insertion mounted on a printed wiring board (PWB). Average damage accumulation rate (DAR) in the inductor leads was measured for random excitations inplane, outofplane, and both directions simultaneously. Under simultaneous multiaxial excitation, the average DAR was found to be 2.2 times greater than the sum of the inplane and outofplane DARs. The conclusion was that multiplestep sequential uniaxial testing may significantly overestimate the durability of large/heavy structures with high center of mass in a multiaxial dynamic environment. Additionally, a test method utilizing uniaxial vibration along a direction other than the principal directions of the structure was examined. This method was found to have significant limitations, but showed better agreement with simultaneous multiaxial vibration experiments.
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      Comparison of Electronic Component Durability Under Uniaxial and Multiaxial Random Vibrations

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    http://yetl.yabesh.ir/yetl1/handle/yetl/157666
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    contributor authorErnst, Matthew
    contributor authorHabtour, Ed
    contributor authorDasgupta, Abhijit
    contributor authorPohland, Michael
    contributor authorRobeson, Mark
    contributor authorPaulus, Mark
    date accessioned2017-05-09T01:16:54Z
    date available2017-05-09T01:16:54Z
    date issued2015
    identifier issn1528-9044
    identifier otherep_137_01_011009.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/157666
    description abstractMultiaxial and uniaxial vibration experiments were conducted in order to study the differences in failure modes and fatigue life for the two types of excitation. An electrodynamic (ED) shaker capable of controlled vibration in six degrees of freedom (DOF) was employed for the experiments. The test specimen consisted of six large inductors insertion mounted on a printed wiring board (PWB). Average damage accumulation rate (DAR) in the inductor leads was measured for random excitations inplane, outofplane, and both directions simultaneously. Under simultaneous multiaxial excitation, the average DAR was found to be 2.2 times greater than the sum of the inplane and outofplane DARs. The conclusion was that multiplestep sequential uniaxial testing may significantly overestimate the durability of large/heavy structures with high center of mass in a multiaxial dynamic environment. Additionally, a test method utilizing uniaxial vibration along a direction other than the principal directions of the structure was examined. This method was found to have significant limitations, but showed better agreement with simultaneous multiaxial vibration experiments.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleComparison of Electronic Component Durability Under Uniaxial and Multiaxial Random Vibrations
    typeJournal Paper
    journal volume137
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4028516
    journal fristpage11009
    journal lastpage11009
    identifier eissn1043-7398
    treeJournal of Electronic Packaging:;2015:;volume( 137 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian