Thermal Management of Time Varying High Heat Flux Electronic DevicesSource: Journal of Electronic Packaging:;2014:;volume( 136 ):;issue: 002::page 21003DOI: 10.1115/1.4027325Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The thermal characteristics of a laboratory pinfin microchannel heat sink were empirically obtained for heat flux, q″, in the range of 30–170 W/cm2, mass flux, m, in the range of 230–380 kg/m2 s, and an exit vapor quality, xout, from 0.2 to 0.75. Refrigerant R 134a (HFC134a) was chosen as the working fluid. The heat sink was a pinfin microchannel module installed in open flow loop. Deviation from the measured average temperatures was 1.5 آ°C at q = 30 W/cm2, and 2.0 آ°C at q = 170 W/cm2. These results indicate that use of pinfin microchannel heat sink enables keeping an electronic device near uniform temperature under steady state and transient conditions. The heat transfer coefficient varied significantly with refrigerant quality and showed a peak at an exit vapor quality of 0.55 in all the experiments. At relatively low heat fluxes and vapor qualities, the heat transfer coefficient increased with vapor quality. At high heat fluxes and vapor qualities, the heat transfer coefficient decreased with vapor quality. A noteworthy feature of the present data is the larger magnitude of the transient heat transfer coefficients compared to values obtained under steady state conditions. The results of transient boiling were compared with those for steady state conditions. In contrast to the more common techniques, the low cost technique, based on open flow loop was developed to promote cooling using micropin fin sinks. Results of this experimental study may be used for designing the cooling high power laser and rocketborn electronic devices.
|
Collections
Show full item record
contributor author | David, T. | |
contributor author | Mendler, D. | |
contributor author | Mosyak, A. | |
contributor author | Bar | |
contributor author | Hetsroni, G. | |
date accessioned | 2017-05-09T01:06:47Z | |
date available | 2017-05-09T01:06:47Z | |
date issued | 2014 | |
identifier issn | 1528-9044 | |
identifier other | ep_136_02_021003.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/154461 | |
description abstract | The thermal characteristics of a laboratory pinfin microchannel heat sink were empirically obtained for heat flux, q″, in the range of 30–170 W/cm2, mass flux, m, in the range of 230–380 kg/m2 s, and an exit vapor quality, xout, from 0.2 to 0.75. Refrigerant R 134a (HFC134a) was chosen as the working fluid. The heat sink was a pinfin microchannel module installed in open flow loop. Deviation from the measured average temperatures was 1.5 آ°C at q = 30 W/cm2, and 2.0 آ°C at q = 170 W/cm2. These results indicate that use of pinfin microchannel heat sink enables keeping an electronic device near uniform temperature under steady state and transient conditions. The heat transfer coefficient varied significantly with refrigerant quality and showed a peak at an exit vapor quality of 0.55 in all the experiments. At relatively low heat fluxes and vapor qualities, the heat transfer coefficient increased with vapor quality. At high heat fluxes and vapor qualities, the heat transfer coefficient decreased with vapor quality. A noteworthy feature of the present data is the larger magnitude of the transient heat transfer coefficients compared to values obtained under steady state conditions. The results of transient boiling were compared with those for steady state conditions. In contrast to the more common techniques, the low cost technique, based on open flow loop was developed to promote cooling using micropin fin sinks. Results of this experimental study may be used for designing the cooling high power laser and rocketborn electronic devices. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Thermal Management of Time Varying High Heat Flux Electronic Devices | |
type | Journal Paper | |
journal volume | 136 | |
journal issue | 2 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.4027325 | |
journal fristpage | 21003 | |
journal lastpage | 21003 | |
identifier eissn | 1043-7398 | |
tree | Journal of Electronic Packaging:;2014:;volume( 136 ):;issue: 002 | |
contenttype | Fulltext |