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    Singularities at Solder Joint Interfaces and Their Effects on Fracture Models

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 002::page 21007
    Author:
    D. Bhate
    ,
    L. Nguyen
    ,
    J. Zhao
    ,
    D. Edwards
    ,
    D. Chan
    ,
    G. Subbarayan
    DOI: 10.1115/1.4001588
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this study, we focus on investigating the nature of the stress and strain behavior in solder joints and their effect on the hybrid damage modeling approach, which is inspired by cohesive zone modeling and Weibull functions [, , 2005, “A Hybrid Model for Computationally Efficient Fatigue Fracture Simulations at Microelectronic Assembly Interfaces,” Int. J. Solids Struct., 42(15), pp. 4468–4483]. We review well understood principles in elastic-plastic fracture mechanics and more recent work in cohesive zone modeling, that address the nature of the singular solutions at the crack tip and provide insight when dealing with the more complex problem of solder joint fracture. Using three-dimensional finite element analysis of a chip scale package, we systematically examine the stress-strain behavior at the edge of the solder joint along the interface. The singular nature of the behavior manifests itself as mesh dependence of the predicted crack front shape and the cycles to failure. We discuss the conditions under which the predicted crack growth rate is of reasonable accuracy by incorporating a characteristic length measure. We validate predictions made by the hybrid damage modeling approach against a companion experimental study in which crack growth was tracked in packages subjected to accelerated thermal cycling.
    keyword(s): Stress , Fracture (Materials) , Solder joints , Finite element analysis , Fracture (Process) AND Failure ,
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      Singularities at Solder Joint Interfaces and Their Effects on Fracture Models

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    contributor authorD. Bhate
    contributor authorL. Nguyen
    contributor authorJ. Zhao
    contributor authorD. Edwards
    contributor authorD. Chan
    contributor authorG. Subbarayan
    date accessioned2017-05-09T00:37:14Z
    date available2017-05-09T00:37:14Z
    date copyrightJune, 2010
    date issued2010
    identifier issn1528-9044
    identifier otherJEPAE4-26304#021007_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142962
    description abstractIn this study, we focus on investigating the nature of the stress and strain behavior in solder joints and their effect on the hybrid damage modeling approach, which is inspired by cohesive zone modeling and Weibull functions [, , 2005, “A Hybrid Model for Computationally Efficient Fatigue Fracture Simulations at Microelectronic Assembly Interfaces,” Int. J. Solids Struct., 42(15), pp. 4468–4483]. We review well understood principles in elastic-plastic fracture mechanics and more recent work in cohesive zone modeling, that address the nature of the singular solutions at the crack tip and provide insight when dealing with the more complex problem of solder joint fracture. Using three-dimensional finite element analysis of a chip scale package, we systematically examine the stress-strain behavior at the edge of the solder joint along the interface. The singular nature of the behavior manifests itself as mesh dependence of the predicted crack front shape and the cycles to failure. We discuss the conditions under which the predicted crack growth rate is of reasonable accuracy by incorporating a characteristic length measure. We validate predictions made by the hybrid damage modeling approach against a companion experimental study in which crack growth was tracked in packages subjected to accelerated thermal cycling.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleSingularities at Solder Joint Interfaces and Their Effects on Fracture Models
    typeJournal Paper
    journal volume132
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4001588
    journal fristpage21007
    identifier eissn1043-7398
    keywordsStress
    keywordsFracture (Materials)
    keywordsSolder joints
    keywordsFinite element analysis
    keywordsFracture (Process) AND Failure
    treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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