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contributor authorXin Li
contributor authorXu Chen
contributor authorGuo-Quan Lu
date accessioned2017-05-09T00:37:13Z
date available2017-05-09T00:37:13Z
date copyrightSeptember, 2010
date issued2010
identifier issn1528-9044
identifier otherJEPAE4-26306#031011_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142953
description abstractAs a solid electroluminescent source, white light emitting diode (LED) has entered a practical stage and become an alternative to replace incandescent and fluorescent light sources. However, due to the increasing integration and miniaturization of LED chips, heat flux inside the chip is also increasing, which puts the packaging into the position to meet higher requirements of heat dissipation. In this study, a new interconnection material—nanosilver paste is used for the LED chip packaging to pursue a better optical performance, since high thermal conductivity of this material can help improve the efficiency of heat dissipation for the LED chip. The bonding ability of this new die-attach material is evaluated by their bonding strength. Moreover, high-power LED modules connected with nanosilver paste, Sn3Ag0.5Cu solder, and silver epoxy are aged under hygrothermal aging and temperature cycling tests. The performances of these LED modules are tested at different aging time. The results show that LED modules sintered with nanosilver paste have the best performance and stability.
publisherThe American Society of Mechanical Engineers (ASME)
titleReliability of High-Power Light Emitting Diode Attached With Different Thermal Interface Materials
typeJournal Paper
journal volume132
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4002299
journal fristpage31011
identifier eissn1043-7398
keywordsHeat
keywordsTemperature
keywordsSilver
keywordsSolders
keywordsReliability
keywordsEpoxy adhesives
keywordsLight-emitting diodes
keywordsThermal conductivity
keywordsBonding
keywordsPackaging AND Energy dissipation
treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 003
contenttypeFulltext


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