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    Multi-Objective Optimization of Thermo-Ultrasonic Flip-Chip Bonding Process for High-Brightness Light Emitting Diodes

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 004::page 41006
    Author:
    Chung-Feng Jeffrey Kuo
    ,
    Hui-Ta Chen
    ,
    Te-Li Su
    ,
    Jr-Da Huang
    DOI: 10.1115/1.4002727
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Flip-chip bonding is a kind of chip packaging technology, which can make fabricated chips lighter and smaller. Thermo-ultrasonic flip-chip bonding is a technology that directly joins gold pad and gold bump. This study combines principle component analysis and gray relational analysis to determine the optimal processing parameters for multiple quality characteristics of light emitting diodes (LEDs). The quality characteristics of this experiment include the candle light, forward voltage, and leakage current of LED and thrust value. First, this study determines the processing parameters that may affect the thermo-ultrasonic flip-chip bonding with the L18 orthogonal array, including substrate temperature, bonding downforce, ultrasonic working time, ultrasonic power, and rising and delay time of tool head bonding. Then, the gray relational analysis is applied to indicate the optimal processing parameters for the multiple quality characteristics of LED. Since the Taguchi method only takes one single quality characteristic into consideration, this study applies the Taguchi method to reduce the number of thermo-ultrasonic flip-chip bonding experiments. The experimental results prove that the optimal LED has good integral quality, which is above industrial standard.
    keyword(s): Bonding , Flip-chip , Leakage , Electric potential , Light-emitting diodes , Temperature , Thrust , Shear (Mechanics) , Delays AND Brightness (Photometry) ,
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      Multi-Objective Optimization of Thermo-Ultrasonic Flip-Chip Bonding Process for High-Brightness Light Emitting Diodes

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    http://yetl.yabesh.ir/yetl1/handle/yetl/142928
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    contributor authorChung-Feng Jeffrey Kuo
    contributor authorHui-Ta Chen
    contributor authorTe-Li Su
    contributor authorJr-Da Huang
    date accessioned2017-05-09T00:37:11Z
    date available2017-05-09T00:37:11Z
    date copyrightDecember, 2010
    date issued2010
    identifier issn1528-9044
    identifier otherJEPAE4-26309#041006_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142928
    description abstractFlip-chip bonding is a kind of chip packaging technology, which can make fabricated chips lighter and smaller. Thermo-ultrasonic flip-chip bonding is a technology that directly joins gold pad and gold bump. This study combines principle component analysis and gray relational analysis to determine the optimal processing parameters for multiple quality characteristics of light emitting diodes (LEDs). The quality characteristics of this experiment include the candle light, forward voltage, and leakage current of LED and thrust value. First, this study determines the processing parameters that may affect the thermo-ultrasonic flip-chip bonding with the L18 orthogonal array, including substrate temperature, bonding downforce, ultrasonic working time, ultrasonic power, and rising and delay time of tool head bonding. Then, the gray relational analysis is applied to indicate the optimal processing parameters for the multiple quality characteristics of LED. Since the Taguchi method only takes one single quality characteristic into consideration, this study applies the Taguchi method to reduce the number of thermo-ultrasonic flip-chip bonding experiments. The experimental results prove that the optimal LED has good integral quality, which is above industrial standard.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMulti-Objective Optimization of Thermo-Ultrasonic Flip-Chip Bonding Process for High-Brightness Light Emitting Diodes
    typeJournal Paper
    journal volume132
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4002727
    journal fristpage41006
    identifier eissn1043-7398
    keywordsBonding
    keywordsFlip-chip
    keywordsLeakage
    keywordsElectric potential
    keywordsLight-emitting diodes
    keywordsTemperature
    keywordsThrust
    keywordsShear (Mechanics)
    keywordsDelays AND Brightness (Photometry)
    treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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