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    Nonlinear Viscoelastic Finite Element Analysis of Physical Aging in an Encapsulated Transformer

    Source: Journal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001::page 11003
    Author:
    M. A. Neidigk
    ,
    Y.-L. Shen
    DOI: 10.1115/1.3068298
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The generation of thermal stresses is a major cause for mechanical failure in encapsulated electronic components. In this study numerical modeling is employed to analyze thermal stresses in a high-voltage transformer encapsulated with filled epoxy. The transformer assembly consists of materials with an extremely disparate range of thermomechanical properties. The thermal histories considered mimic those in the operational condition. It is found that, upon thermal cooling from elevated temperature, the ceramic core can be under local tensile stress although it is entirely surrounded by materials with much greater coefficients of thermal expansion. The unique aspect of this paper originates from the fact that the volume shrinkage of the viscoelastic encapsulant during physical aging contributes to an increase in stress over time, thus increasing the tendency of fracture. This counter intuitive result (stress increase due to nonlinear viscoelastic physical aging) can now be predicted using constitutive models recently developed at Sandia National Laboratories. When a silicone coating between the core and the encapsulation is included, the stress is significantly reduced. The modeling result is shown to corroborate with the actual performance of the transformer.
    keyword(s): Coating processes , Coatings , Ceramics , Computer simulation , Manufacturing , Ferrites (Magnetic materials) , Stress , Epoxy adhesives , Finite element analysis , Fracture (Process) , Modeling , Temperature , Cooling , Silicones , Tension , Thermal expansion , Failure , Thermal stresses , Elastic analysis , Cycles , Electric potential AND Shrinkage (Materials) ,
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      Nonlinear Viscoelastic Finite Element Analysis of Physical Aging in an Encapsulated Transformer

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    http://yetl.yabesh.ir/yetl1/handle/yetl/140319
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    contributor authorM. A. Neidigk
    contributor authorY.-L. Shen
    date accessioned2017-05-09T00:32:21Z
    date available2017-05-09T00:32:21Z
    date copyrightMarch, 2009
    date issued2009
    identifier issn1528-9044
    identifier otherJEPAE4-26292#011003_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/140319
    description abstractThe generation of thermal stresses is a major cause for mechanical failure in encapsulated electronic components. In this study numerical modeling is employed to analyze thermal stresses in a high-voltage transformer encapsulated with filled epoxy. The transformer assembly consists of materials with an extremely disparate range of thermomechanical properties. The thermal histories considered mimic those in the operational condition. It is found that, upon thermal cooling from elevated temperature, the ceramic core can be under local tensile stress although it is entirely surrounded by materials with much greater coefficients of thermal expansion. The unique aspect of this paper originates from the fact that the volume shrinkage of the viscoelastic encapsulant during physical aging contributes to an increase in stress over time, thus increasing the tendency of fracture. This counter intuitive result (stress increase due to nonlinear viscoelastic physical aging) can now be predicted using constitutive models recently developed at Sandia National Laboratories. When a silicone coating between the core and the encapsulation is included, the stress is significantly reduced. The modeling result is shown to corroborate with the actual performance of the transformer.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleNonlinear Viscoelastic Finite Element Analysis of Physical Aging in an Encapsulated Transformer
    typeJournal Paper
    journal volume131
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.3068298
    journal fristpage11003
    identifier eissn1043-7398
    keywordsCoating processes
    keywordsCoatings
    keywordsCeramics
    keywordsComputer simulation
    keywordsManufacturing
    keywordsFerrites (Magnetic materials)
    keywordsStress
    keywordsEpoxy adhesives
    keywordsFinite element analysis
    keywordsFracture (Process)
    keywordsModeling
    keywordsTemperature
    keywordsCooling
    keywordsSilicones
    keywordsTension
    keywordsThermal expansion
    keywordsFailure
    keywordsThermal stresses
    keywordsElastic analysis
    keywordsCycles
    keywordsElectric potential AND Shrinkage (Materials)
    treeJournal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001
    contenttypeFulltext
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