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    Influence of Thermomigration on Lead-Free Solder Joint Mechanical Properties

    Source: Journal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001::page 11002
    Author:
    Mohd F. Abdulhamid
    ,
    Cemal Basaran
    DOI: 10.1115/1.3068296
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermomigration experiments were conducted to study the change in mechanical properties of 95.5Sn–4Ag–0.5Cu (SAC405) lead-free solder joint under high temperature gradients. This paper presents some observations on samples that were subjected to 1000°C/cm thermal gradient (TG) for 286 h, 712 h, and 1156 h. It was observed that samples subjected to thermal gradient did not develop a Cu3Sn intermetallic compound (IMC) layer, and we observed disintegration of Cu6Sn5 IMC. On the other hand, samples subjected to isothermal annealing exhibited IMC growth. In samples subjected to thermomigration, near the cold side the Cu concentration is significantly higher compared with hot side. Extensive surface hardness testing showed an increase in hardness from the hot to cold sides, which possibly indicates that Sn grain coarsening is in the same direction.
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      Influence of Thermomigration on Lead-Free Solder Joint Mechanical Properties

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    http://yetl.yabesh.ir/yetl1/handle/yetl/140318
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    contributor authorMohd F. Abdulhamid
    contributor authorCemal Basaran
    date accessioned2017-05-09T00:32:21Z
    date available2017-05-09T00:32:21Z
    date copyrightMarch, 2009
    date issued2009
    identifier issn1528-9044
    identifier otherJEPAE4-26292#011002_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/140318
    description abstractThermomigration experiments were conducted to study the change in mechanical properties of 95.5Sn–4Ag–0.5Cu (SAC405) lead-free solder joint under high temperature gradients. This paper presents some observations on samples that were subjected to 1000°C/cm thermal gradient (TG) for 286 h, 712 h, and 1156 h. It was observed that samples subjected to thermal gradient did not develop a Cu3Sn intermetallic compound (IMC) layer, and we observed disintegration of Cu6Sn5 IMC. On the other hand, samples subjected to isothermal annealing exhibited IMC growth. In samples subjected to thermomigration, near the cold side the Cu concentration is significantly higher compared with hot side. Extensive surface hardness testing showed an increase in hardness from the hot to cold sides, which possibly indicates that Sn grain coarsening is in the same direction.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleInfluence of Thermomigration on Lead-Free Solder Joint Mechanical Properties
    typeJournal Paper
    journal volume131
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.3068296
    journal fristpage11002
    identifier eissn1043-7398
    treeJournal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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