| contributor author | Rifat Sipahi | |
| contributor author | Hassan Fazelinia | |
| contributor author | Nejat Olgac | |
| date accessioned | 2017-05-09T00:32:08Z | |
| date available | 2017-05-09T00:32:08Z | |
| date copyright | September, 2009 | |
| date issued | 2009 | |
| identifier issn | 0022-0434 | |
| identifier other | JDSMAA-26502#051013_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/140186 | |
| description abstract | A practical numerical procedure is introduced for determining the stability robustness map of a general class of higher order linear time invariant systems with three independent delays, against uncertainties in the delays. The procedure is based on an efficient and exhaustive frequency-sweeping technique within a single loop. This operation results in determination of the complete description of the kernel and the offspring hypersurfaces, which constitute exhaustively the potential stability switching loci in the space of the delays. The new numerical procedure corresponds to the first step in the overarching framework, called the cluster treatment of characteristic roots. The results of this treatment can also be represented in another domain (called the spectral delay space) within a finite dimensional cube called the building block, which is much simpler to view and analyze. The paper also offers several case studies to demonstrate the practicality of the new numerical methodology. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Stability Analysis of LTI Systems With Three Independent Delays—A Computationally Efficient Procedure | |
| type | Journal Paper | |
| journal volume | 131 | |
| journal issue | 5 | |
| journal title | Journal of Dynamic Systems, Measurement, and Control | |
| identifier doi | 10.1115/1.3117220 | |
| journal fristpage | 51013 | |
| identifier eissn | 1528-9028 | |
| keywords | Stability | |
| keywords | Delays | |
| keywords | Algorithms AND Blocks (Building materials) | |
| tree | Journal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 005 | |
| contenttype | Fulltext | |