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    Development of the Damage State Variable for a Unified Creep Plasticity Damage Constitutive Model of the 95.5Sn–3.9Ag–0.6Cu Lead-Free Solder

    Source: Journal of Electronic Packaging:;2008:;volume( 130 ):;issue: 001::page 11002
    Author:
    David M. Pierce
    ,
    Arlo F. Fossum
    ,
    Paul T. Vianco
    ,
    Sheri D. Sheppard
    ,
    Mike K. Neilsen
    DOI: 10.1115/1.2837513
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A unified creep plasticity damage (UCPD) constitutive model was developed to predict the fatigue of 95.5Sn–3.9Ag–0.6Cu solder joints. Compression, stress-strain and creep properties were generated in previous studies of this solder. Crack damage was reflected in a single state variable, Dω, in the model. Isothermal fatigue tests were performed at 25°C, 100°C, and 160°C using a double-lap shear test specimen. A new approach to fitting the revised damage model is proposed based on finite element analysis (FEA) simulation of the load decay of the fatigued solder material. Accurate predictions required that those parameters be temperature dependent. The UCPD constitutive model was successfully implemented as a subroutine in the commercial finite element code ANSYS ®. Consistent predictions were obtained as demonstrated by a comparison of results generated from FEA simulation of the test assembly against analogous experimental results.
    keyword(s): Simulation , Stress , Shear (Mechanics) , Constitutive equations , Finite element analysis , Testing , Plasticity , Creep , Fatigue , Temperature , Alloys , Solders , Solder joints , Manufacturing , Fatigue testing , Lead-free solders AND Fittings ,
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      Development of the Damage State Variable for a Unified Creep Plasticity Damage Constitutive Model of the 95.5Sn–3.9Ag–0.6Cu Lead-Free Solder

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    http://yetl.yabesh.ir/yetl1/handle/yetl/137780
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    contributor authorDavid M. Pierce
    contributor authorArlo F. Fossum
    contributor authorPaul T. Vianco
    contributor authorSheri D. Sheppard
    contributor authorMike K. Neilsen
    date accessioned2017-05-09T00:27:37Z
    date available2017-05-09T00:27:37Z
    date copyrightMarch, 2008
    date issued2008
    identifier issn1528-9044
    identifier otherJEPAE4-26283#011002_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/137780
    description abstractA unified creep plasticity damage (UCPD) constitutive model was developed to predict the fatigue of 95.5Sn–3.9Ag–0.6Cu solder joints. Compression, stress-strain and creep properties were generated in previous studies of this solder. Crack damage was reflected in a single state variable, Dω, in the model. Isothermal fatigue tests were performed at 25°C, 100°C, and 160°C using a double-lap shear test specimen. A new approach to fitting the revised damage model is proposed based on finite element analysis (FEA) simulation of the load decay of the fatigued solder material. Accurate predictions required that those parameters be temperature dependent. The UCPD constitutive model was successfully implemented as a subroutine in the commercial finite element code ANSYS ®. Consistent predictions were obtained as demonstrated by a comparison of results generated from FEA simulation of the test assembly against analogous experimental results.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDevelopment of the Damage State Variable for a Unified Creep Plasticity Damage Constitutive Model of the 95.5Sn–3.9Ag–0.6Cu Lead-Free Solder
    typeJournal Paper
    journal volume130
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2837513
    journal fristpage11002
    identifier eissn1043-7398
    keywordsSimulation
    keywordsStress
    keywordsShear (Mechanics)
    keywordsConstitutive equations
    keywordsFinite element analysis
    keywordsTesting
    keywordsPlasticity
    keywordsCreep
    keywordsFatigue
    keywordsTemperature
    keywordsAlloys
    keywordsSolders
    keywordsSolder joints
    keywordsManufacturing
    keywordsFatigue testing
    keywordsLead-free solders AND Fittings
    treeJournal of Electronic Packaging:;2008:;volume( 130 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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