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    The Effects of Multiple Zincation Process on Aluminum Bond Pad Surface for Electroless Nickel Immersion Gold Deposition

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 003::page 246
    Author:
    M. K. Md Arshad
    ,
    I. Ahmad
    ,
    A. Jalar
    ,
    G. Omar
    ,
    U. Hashim
    DOI: 10.1115/1.2229223
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper reports the effects of a multiple zincation process on the Al bond pad surface prior to electroless nickel immersion gold deposition. The study of multiple zincation comprises the surface topography and morphology of the appearance of the Al bond pad. In addition, by comprehension of the effects of the multiple zincation process, the study includes investigating the Al dissolution rate and adhesion strength between eutectic a 37Pb∕63Sn solder ball and an under bump metallurgy (UBM) interface. Scanning electron microscopy, energy dispersive x-ray, atomic force microscopy, focused ion beam, and an Intellectest STORM series FA1500 shear tester were used as analytical tools in this study. The results suggest that the first zincation process follows the contour of the initial bond pad. The second zincation produces a slightly better surface appearance with a smooth and fine Zn crystallite. The Zn crystallites become a continuous film with the deposits looking like an island formation after the third zincation. The smooth surface of the third zincation, as an effect of multiple zincation, is later transferred to Ni and Au surfaces. The smooth surface of the UBM leads to a better shear strength with only a minimum Al dissolved.
    keyword(s): Aluminum , Nickel , Solders , Shear (Mechanics) , Shear strength , Thickness , Atomic force microscopy , X-rays , Metallurgy , Storms , Scanning electron microscopy AND Focused ion beams ,
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      The Effects of Multiple Zincation Process on Aluminum Bond Pad Surface for Electroless Nickel Immersion Gold Deposition

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/133526
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    contributor authorM. K. Md Arshad
    contributor authorI. Ahmad
    contributor authorA. Jalar
    contributor authorG. Omar
    contributor authorU. Hashim
    date accessioned2017-05-09T00:19:34Z
    date available2017-05-09T00:19:34Z
    date copyrightSeptember, 2006
    date issued2006
    identifier issn1528-9044
    identifier otherJEPAE4-26264#246_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/133526
    description abstractThis paper reports the effects of a multiple zincation process on the Al bond pad surface prior to electroless nickel immersion gold deposition. The study of multiple zincation comprises the surface topography and morphology of the appearance of the Al bond pad. In addition, by comprehension of the effects of the multiple zincation process, the study includes investigating the Al dissolution rate and adhesion strength between eutectic a 37Pb∕63Sn solder ball and an under bump metallurgy (UBM) interface. Scanning electron microscopy, energy dispersive x-ray, atomic force microscopy, focused ion beam, and an Intellectest STORM series FA1500 shear tester were used as analytical tools in this study. The results suggest that the first zincation process follows the contour of the initial bond pad. The second zincation produces a slightly better surface appearance with a smooth and fine Zn crystallite. The Zn crystallites become a continuous film with the deposits looking like an island formation after the third zincation. The smooth surface of the third zincation, as an effect of multiple zincation, is later transferred to Ni and Au surfaces. The smooth surface of the UBM leads to a better shear strength with only a minimum Al dissolved.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThe Effects of Multiple Zincation Process on Aluminum Bond Pad Surface for Electroless Nickel Immersion Gold Deposition
    typeJournal Paper
    journal volume128
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2229223
    journal fristpage246
    journal lastpage250
    identifier eissn1043-7398
    keywordsAluminum
    keywordsNickel
    keywordsSolders
    keywordsShear (Mechanics)
    keywordsShear strength
    keywordsThickness
    keywordsAtomic force microscopy
    keywordsX-rays
    keywordsMetallurgy
    keywordsStorms
    keywordsScanning electron microscopy AND Focused ion beams
    treeJournal of Electronic Packaging:;2006:;volume( 128 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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