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    Interfacial Adhesion of Anisotropic Conductive Adhesives on Polyimide Substrate

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 001::page 43
    Author:
    Liqiang Cao
    ,
    Zonghe Lai
    ,
    Johan Liu
    DOI: 10.1115/1.1846066
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: There has been steadily increasing interest in using electrically conductive adhesives as interconnecting materials in electronics manufacturing. Simple processing, low processing temperature and fine pitch capability are the major advantages of conducting adhesive technology. A new and innovative connection technology geared towards achieving increased functionality at a lower total system cost is anisotropic conductive adhesive (ACA) interconnection. ACAs, when used for flip chip assembly, provide electrical as well as mechanical interconnections for fine pitch applications. This work deals with adhesion issues between ACA on polyimide materials. The paper presents a reliability assessment of adhesive joints using ACA on polyimide substrate that was conducted by testing samples at various aging temperature, high humidity and high pressure environments. The effects of high temperature and high humidity on the bond strength of ACA joints were measured using 90 deg peel test as well as by microstructural examination. It was found that aging generally caused a decrease in peel strength, especially the results of scanning electronic microscopy showed that the pressure cooker test could most effectively reveal the adhesion behavior.
    keyword(s): Adhesives , Testing , Pressure , Temperature AND Fracture toughness ,
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      Interfacial Adhesion of Anisotropic Conductive Adhesives on Polyimide Substrate

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/131671
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    • Journal of Electronic Packaging

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    contributor authorLiqiang Cao
    contributor authorZonghe Lai
    contributor authorJohan Liu
    date accessioned2017-05-09T00:15:54Z
    date available2017-05-09T00:15:54Z
    date copyrightMarch, 2005
    date issued2005
    identifier issn1528-9044
    identifier otherJEPAE4-26242#43_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/131671
    description abstractThere has been steadily increasing interest in using electrically conductive adhesives as interconnecting materials in electronics manufacturing. Simple processing, low processing temperature and fine pitch capability are the major advantages of conducting adhesive technology. A new and innovative connection technology geared towards achieving increased functionality at a lower total system cost is anisotropic conductive adhesive (ACA) interconnection. ACAs, when used for flip chip assembly, provide electrical as well as mechanical interconnections for fine pitch applications. This work deals with adhesion issues between ACA on polyimide materials. The paper presents a reliability assessment of adhesive joints using ACA on polyimide substrate that was conducted by testing samples at various aging temperature, high humidity and high pressure environments. The effects of high temperature and high humidity on the bond strength of ACA joints were measured using 90 deg peel test as well as by microstructural examination. It was found that aging generally caused a decrease in peel strength, especially the results of scanning electronic microscopy showed that the pressure cooker test could most effectively reveal the adhesion behavior.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleInterfacial Adhesion of Anisotropic Conductive Adhesives on Polyimide Substrate
    typeJournal Paper
    journal volume127
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1846066
    journal fristpage43
    journal lastpage46
    identifier eissn1043-7398
    keywordsAdhesives
    keywordsTesting
    keywordsPressure
    keywordsTemperature AND Fracture toughness
    treeJournal of Electronic Packaging:;2005:;volume( 127 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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