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    Low Cycle Fatigue Testing of Ball Grid Array Solder Joints under Mixed-Mode Loading Conditions

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 003::page 237
    Author:
    Tae-Sang Park
    ,
    Soon-Bok Lee
    DOI: 10.1115/1.1871192
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: To give a proper and accurate estimation of the fatigue life of ball grid array (BGA) solder joints, a mechanical fatigue test method under mixed-mode loading is proposed. Experiments were conducted with 63Sn∕37Pb and Sn∕3.5Ag∕0.75Cu solder joints in room temperature. The mechanical low cycle fatigue tests were performed under several loading angles. The loading angle is controlled by several grips which have specific surface angle to the loading direction. Constant displacement controlled tests are performed using a micro-mechanical test apparatus. It was found that the normal deformation significantly affects the fatigue life of the solder joint. Throughout the whole test conditions at room temperature, Sn∕3.5Ag∕0.75Cu solder alloy had longer fatigue life than 63Sn∕37Pb alloy. Failure patterns of the fatigue tests were observed and discussed. A morrow energy model was examined and found to be a proper low cycle fatigue model for solder joints under mixed mode loading condition.
    keyword(s): Solders , Stress , Testing , Displacement , Fatigue life , Low cycle fatigue , Solder joints , Ball-Grid-Array packaging , Alloys , Fatigue testing , Cycles , Temperature , Failure , Drops AND Force ,
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      Low Cycle Fatigue Testing of Ball Grid Array Solder Joints under Mixed-Mode Loading Conditions

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    http://yetl.yabesh.ir/yetl1/handle/yetl/131626
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    contributor authorTae-Sang Park
    contributor authorSoon-Bok Lee
    date accessioned2017-05-09T00:15:51Z
    date available2017-05-09T00:15:51Z
    date copyrightSeptember, 2005
    date issued2005
    identifier issn1528-9044
    identifier otherJEPAE4-26247#237_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/131626
    description abstractTo give a proper and accurate estimation of the fatigue life of ball grid array (BGA) solder joints, a mechanical fatigue test method under mixed-mode loading is proposed. Experiments were conducted with 63Sn∕37Pb and Sn∕3.5Ag∕0.75Cu solder joints in room temperature. The mechanical low cycle fatigue tests were performed under several loading angles. The loading angle is controlled by several grips which have specific surface angle to the loading direction. Constant displacement controlled tests are performed using a micro-mechanical test apparatus. It was found that the normal deformation significantly affects the fatigue life of the solder joint. Throughout the whole test conditions at room temperature, Sn∕3.5Ag∕0.75Cu solder alloy had longer fatigue life than 63Sn∕37Pb alloy. Failure patterns of the fatigue tests were observed and discussed. A morrow energy model was examined and found to be a proper low cycle fatigue model for solder joints under mixed mode loading condition.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleLow Cycle Fatigue Testing of Ball Grid Array Solder Joints under Mixed-Mode Loading Conditions
    typeJournal Paper
    journal volume127
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1871192
    journal fristpage237
    journal lastpage244
    identifier eissn1043-7398
    keywordsSolders
    keywordsStress
    keywordsTesting
    keywordsDisplacement
    keywordsFatigue life
    keywordsLow cycle fatigue
    keywordsSolder joints
    keywordsBall-Grid-Array packaging
    keywordsAlloys
    keywordsFatigue testing
    keywordsCycles
    keywordsTemperature
    keywordsFailure
    keywordsDrops AND Force
    treeJournal of Electronic Packaging:;2005:;volume( 127 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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