contributor author | Qian Zhang | |
contributor author | Abhijit Dasgupta | |
contributor author | Peter Haswell | |
date accessioned | 2017-05-09T00:15:50Z | |
date available | 2017-05-09T00:15:50Z | |
date copyright | December, 2005 | |
date issued | 2005 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26254#512_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/131616 | |
description abstract | This study is motivated by the urgent need in the electronics industry for mechanical properties and durability of Pb-free solders because the use of Pb will be banned in the EU by July 1, 2006. The isothermal mechanical durability of three NEMI recommended Pb-free solders, 95.5Sn-3.9Ag-0.6Cu, 96.5Sn-3.5Ag, and 99.3Sn-0.7Cu, is tested on the thermo-mechanical-microscale (TMM) setup under two test conditions: room temperature and relatively high strain rate, and high temperature and low strain rate. The test data are presented in a power law relationship between three selected damage metrics (total strain range, inelastic strain range, and cyclic work density) to 50% load drop. The obtained mechanical durability models of three Pb-free solders are compared with those of the eutectic 63Sn-37Pb solder at the two selected test conditions and at the same homologous temperature of 0.75. The results of this study can be used for virtual qualification of Pb-free electronics during design and development of electronics under mechanical loading. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Isothermal Mechanical Durability of Three Selected PB-Free Solders: Sn3.9Ag0.6Cu, Sn3.5Ag, and Sn0.7Cu | |
type | Journal Paper | |
journal volume | 127 | |
journal issue | 4 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.2056569 | |
journal fristpage | 512 | |
journal lastpage | 522 | |
identifier eissn | 1043-7398 | |
keywords | Temperature | |
keywords | Solders | |
keywords | Stress | |
keywords | Durability | |
keywords | Lead-free solders | |
keywords | Drops | |
keywords | Solder joints AND High temperature | |
tree | Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 004 | |
contenttype | Fulltext | |