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    Board Level Drop Impact—Fundamental and Parametric Analysis

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 004::page 496
    Author:
    E. H. Wong
    ,
    Y-W Mai
    ,
    S. K. Seah
    DOI: 10.1115/1.2065747
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A fundamental understanding of the dynamics of the PCB assembly when subjected to a half-sine acceleration has also been obtained through analyzing the PCB as a spring mass system, a beam, and a plate, respectively. The magnitude of stresses in solder interconnection due to flexing of the PCB is two orders higher than the magnitude of the stresses induced by acceleration and inertia loading the IC package. By ignoring the inertia loading, computational effort to evaluate the interconnection stresses due to PCB flexing can be reduced significantly via a two-step dynamic-static analysis. The dynamic analysis is first performed to evaluate the PCB bending moment adjacent the package, and is followed by a static analysis where the PCB bending moment is applied around the package. Parametric studies performed suggest a fundamental difference in designing for drop impact and designing for temperature cycling. The well-known design rules for temperature cycling—minimizing package length and maximizing interconnection standoff—does not work for drop impact. Instead, drop impact reliability can be enhanced by increasing the interconnection diameter, reducing the modulus of the interconnection materials, reducing the span of the PCB, or using either a very thin or a very thick PCB.
    keyword(s): Dynamics (Mechanics) , Stress , Drops , Springs AND Manufacturing ,
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      Board Level Drop Impact—Fundamental and Parametric Analysis

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/131614
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    • Journal of Electronic Packaging

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    contributor authorE. H. Wong
    contributor authorY-W Mai
    contributor authorS. K. Seah
    date accessioned2017-05-09T00:15:50Z
    date available2017-05-09T00:15:50Z
    date copyrightDecember, 2005
    date issued2005
    identifier issn1528-9044
    identifier otherJEPAE4-26254#496_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/131614
    description abstractA fundamental understanding of the dynamics of the PCB assembly when subjected to a half-sine acceleration has also been obtained through analyzing the PCB as a spring mass system, a beam, and a plate, respectively. The magnitude of stresses in solder interconnection due to flexing of the PCB is two orders higher than the magnitude of the stresses induced by acceleration and inertia loading the IC package. By ignoring the inertia loading, computational effort to evaluate the interconnection stresses due to PCB flexing can be reduced significantly via a two-step dynamic-static analysis. The dynamic analysis is first performed to evaluate the PCB bending moment adjacent the package, and is followed by a static analysis where the PCB bending moment is applied around the package. Parametric studies performed suggest a fundamental difference in designing for drop impact and designing for temperature cycling. The well-known design rules for temperature cycling—minimizing package length and maximizing interconnection standoff—does not work for drop impact. Instead, drop impact reliability can be enhanced by increasing the interconnection diameter, reducing the modulus of the interconnection materials, reducing the span of the PCB, or using either a very thin or a very thick PCB.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleBoard Level Drop Impact—Fundamental and Parametric Analysis
    typeJournal Paper
    journal volume127
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2065747
    journal fristpage496
    journal lastpage502
    identifier eissn1043-7398
    keywordsDynamics (Mechanics)
    keywordsStress
    keywordsDrops
    keywordsSprings AND Manufacturing
    treeJournal of Electronic Packaging:;2005:;volume( 127 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian