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    Dynamic Reduced Electrothermal Model for Integrated Power Electronics Modules (IPEM)

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 004::page 477
    Author:
    M. Hernández-Mora
    ,
    J. E. González
    ,
    M. Vélez-Reyes
    ,
    Y. Pang
    ,
    E. Scott
    ,
    J. M. Ortiz-Rodrı́guez
    DOI: 10.1115/1.1827264
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Background: This paper presents a reduced mathematical model using a practical numerical formulation of the thermal behavior of an integrated power electronics module (IPEM). This model is based on the expanded lumped thermal capacitance method (LTCM), in which the number of variables involved in the analysis of heat transfer is reduced only to time. Method of Approach: By applying the LTCM, a simple, nonspatial, but highly nonlinear model is obtained for the case of the IPEM Generation II. Steady and transient results of the model are validated against results from a three-dimensional, transient thermal analysis software tool, FLOTHERM™ 3.1. The electrothermal coupling was obtained by implementing the reduced-order thermal model into the SABER™ circuit simulator. Two experimental setups, for low- and high-speed thermal responses, were developed and used to calibrate the reduced model with actual data. Results: The comparison of the LTCM model implemented in a Generation II IPEM with FLOTHERM 3.1 results compared very favorably in terms of accuracy and efficiency, reducing the computational time significantly. Additional validations of the reduced thermal model were made using experiment data for the low-speed thermal response at different constant powers, and good agreement was demonstrated in all cases. A comparison between SABER™ simulations, which incorporated the proposed LTCM, and the fast thermal experimental response results is also presented to validate the dynamic electrothermal model response, and excellent agreement was found for this case. Conclusions: The good agreement found for all three cases presented, the three-dimensional, transient numerical formulation, and the low- and high-speed experimental data indicates that reduced electrothermal models are an excellent alterative for design methodologies of new generations of IPEMs.
    keyword(s): Heat , Temperature , Heat transfer , Capacitance , Computer software , Electronics , Design , Heat conduction , Electrical resistance , Integrated circuits , Simulation , Gates (Closures) , Radiation (Physics) , Project tasks , Thermal analysis , Steady state , Materials properties , Convection , Speed , Engineering simulation AND Circuits ,
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      Dynamic Reduced Electrothermal Model for Integrated Power Electronics Modules (IPEM)

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/129830
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    • Journal of Electronic Packaging

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    contributor authorM. Hernández-Mora
    contributor authorJ. E. González
    contributor authorM. Vélez-Reyes
    contributor authorY. Pang
    contributor authorE. Scott
    contributor authorJ. M. Ortiz-Rodrı́guez
    date accessioned2017-05-09T00:12:40Z
    date available2017-05-09T00:12:40Z
    date copyrightDecember, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26239#477_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129830
    description abstractBackground: This paper presents a reduced mathematical model using a practical numerical formulation of the thermal behavior of an integrated power electronics module (IPEM). This model is based on the expanded lumped thermal capacitance method (LTCM), in which the number of variables involved in the analysis of heat transfer is reduced only to time. Method of Approach: By applying the LTCM, a simple, nonspatial, but highly nonlinear model is obtained for the case of the IPEM Generation II. Steady and transient results of the model are validated against results from a three-dimensional, transient thermal analysis software tool, FLOTHERM™ 3.1. The electrothermal coupling was obtained by implementing the reduced-order thermal model into the SABER™ circuit simulator. Two experimental setups, for low- and high-speed thermal responses, were developed and used to calibrate the reduced model with actual data. Results: The comparison of the LTCM model implemented in a Generation II IPEM with FLOTHERM 3.1 results compared very favorably in terms of accuracy and efficiency, reducing the computational time significantly. Additional validations of the reduced thermal model were made using experiment data for the low-speed thermal response at different constant powers, and good agreement was demonstrated in all cases. A comparison between SABER™ simulations, which incorporated the proposed LTCM, and the fast thermal experimental response results is also presented to validate the dynamic electrothermal model response, and excellent agreement was found for this case. Conclusions: The good agreement found for all three cases presented, the three-dimensional, transient numerical formulation, and the low- and high-speed experimental data indicates that reduced electrothermal models are an excellent alterative for design methodologies of new generations of IPEMs.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDynamic Reduced Electrothermal Model for Integrated Power Electronics Modules (IPEM)
    typeJournal Paper
    journal volume126
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1827264
    journal fristpage477
    journal lastpage490
    identifier eissn1043-7398
    keywordsHeat
    keywordsTemperature
    keywordsHeat transfer
    keywordsCapacitance
    keywordsComputer software
    keywordsElectronics
    keywordsDesign
    keywordsHeat conduction
    keywordsElectrical resistance
    keywordsIntegrated circuits
    keywordsSimulation
    keywordsGates (Closures)
    keywordsRadiation (Physics)
    keywordsProject tasks
    keywordsThermal analysis
    keywordsSteady state
    keywordsMaterials properties
    keywordsConvection
    keywordsSpeed
    keywordsEngineering simulation AND Circuits
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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