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    Short-Term Characterization of Building Integrated Photovoltaic Panels*

    Source: Journal of Solar Energy Engineering:;2003:;volume( 125 ):;issue: 001::page 13
    Author:
    A. Hunter Fanney
    ,
    Brian P. Dougherty
    ,
    Mark W. Davis
    DOI: 10.1115/1.1531642
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Building integrated photovoltaics, the integration of photovoltaic cells into one or more exterior building surfaces, represents a small but growing part of today’s $2 billion dollar photovoltaic industry. A barrier to the widespread use of building integrated photovoltaics (BIPV) is the lack of validated predictive simulation tools needed to make informed economic decisions. The National Institute of Standards and Technology (NIST) has undertaken a multi-year project to compare the measured performance of BIPV panels to the predictions of photovoltaic simulation tools. The existing simulation models require input parameters that characterize the electrical performance of BIPV panels subjected to various meteorological conditions. This paper describes the experimental apparatus and test procedures used to capture the required parameters. Results are presented for custom fabricated mono-crystalline, polycrystalline, and silicon film BIPV panels and a commercially available triple junction amorphous silicon panel.
    keyword(s): Solar energy , Circuits , Junctions , Silicon , National Institute of Standards and Technology , Temperature , Electric potential AND Measurement ,
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      Short-Term Characterization of Building Integrated Photovoltaic Panels*

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/129079
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    • Journal of Solar Energy Engineering

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    contributor authorA. Hunter Fanney
    contributor authorBrian P. Dougherty
    contributor authorMark W. Davis
    date accessioned2017-05-09T00:11:25Z
    date available2017-05-09T00:11:25Z
    date copyrightFebruary, 2003
    date issued2003
    identifier issn0199-6231
    identifier otherJSEEDO-28332#13_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129079
    description abstractBuilding integrated photovoltaics, the integration of photovoltaic cells into one or more exterior building surfaces, represents a small but growing part of today’s $2 billion dollar photovoltaic industry. A barrier to the widespread use of building integrated photovoltaics (BIPV) is the lack of validated predictive simulation tools needed to make informed economic decisions. The National Institute of Standards and Technology (NIST) has undertaken a multi-year project to compare the measured performance of BIPV panels to the predictions of photovoltaic simulation tools. The existing simulation models require input parameters that characterize the electrical performance of BIPV panels subjected to various meteorological conditions. This paper describes the experimental apparatus and test procedures used to capture the required parameters. Results are presented for custom fabricated mono-crystalline, polycrystalline, and silicon film BIPV panels and a commercially available triple junction amorphous silicon panel.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleShort-Term Characterization of Building Integrated Photovoltaic Panels*
    typeJournal Paper
    journal volume125
    journal issue1
    journal titleJournal of Solar Energy Engineering
    identifier doi10.1115/1.1531642
    journal fristpage13
    journal lastpage20
    identifier eissn1528-8986
    keywordsSolar energy
    keywordsCircuits
    keywordsJunctions
    keywordsSilicon
    keywordsNational Institute of Standards and Technology
    keywordsTemperature
    keywordsElectric potential AND Measurement
    treeJournal of Solar Energy Engineering:;2003:;volume( 125 ):;issue: 001
    contenttypeFulltext
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