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contributor authorA. Hunter Fanney
contributor authorBrian P. Dougherty
contributor authorMark W. Davis
date accessioned2017-05-09T00:11:25Z
date available2017-05-09T00:11:25Z
date copyrightFebruary, 2003
date issued2003
identifier issn0199-6231
identifier otherJSEEDO-28332#13_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129079
description abstractBuilding integrated photovoltaics, the integration of photovoltaic cells into one or more exterior building surfaces, represents a small but growing part of today’s $2 billion dollar photovoltaic industry. A barrier to the widespread use of building integrated photovoltaics (BIPV) is the lack of validated predictive simulation tools needed to make informed economic decisions. The National Institute of Standards and Technology (NIST) has undertaken a multi-year project to compare the measured performance of BIPV panels to the predictions of photovoltaic simulation tools. The existing simulation models require input parameters that characterize the electrical performance of BIPV panels subjected to various meteorological conditions. This paper describes the experimental apparatus and test procedures used to capture the required parameters. Results are presented for custom fabricated mono-crystalline, polycrystalline, and silicon film BIPV panels and a commercially available triple junction amorphous silicon panel.
publisherThe American Society of Mechanical Engineers (ASME)
titleShort-Term Characterization of Building Integrated Photovoltaic Panels*
typeJournal Paper
journal volume125
journal issue1
journal titleJournal of Solar Energy Engineering
identifier doi10.1115/1.1531642
journal fristpage13
journal lastpage20
identifier eissn1528-8986
keywordsSolar energy
keywordsCircuits
keywordsJunctions
keywordsSilicon
keywordsNational Institute of Standards and Technology
keywordsTemperature
keywordsElectric potential AND Measurement
treeJournal of Solar Energy Engineering:;2003:;volume( 125 ):;issue: 001
contenttypeFulltext


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