contributor author | Hong Tang | |
contributor author | Cemal Basaran | |
contributor author | Associate Professor and Director | |
date accessioned | 2017-05-09T00:09:56Z | |
date available | 2017-05-09T00:09:56Z | |
date copyright | March, 2003 | |
date issued | 2003 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26212#120_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/128251 | |
description abstract | A thermomechanical fatigue life prediction model based on the theory of damage mechanics is presented. The damage evolution, corresponding to the material degradation under cyclic thermomechanical loading, is quantified thermodynamic framework. The damage, as an internal state variable, is coupled with unified viscoplastic constitutive model to characterize the response of solder alloys. The damage-coupled viscoplastic model with kinematic and isotropic hardening is implemented in ABAQUS finite element package to simulate the cyclic softening behavior of solder joints. Several computational simulations of uniaxial monotonic tensile and cyclic shear tests are conducted to validate the model with experimental results. The behavior of an actual ball grid array (BGA) package under thermal fatigue loading is also simulated and compared with experimental results. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | A Damage Mechanics-Based Fatigue Life Prediction Model for Solder Joints | |
type | Journal Paper | |
journal volume | 125 | |
journal issue | 1 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.1536171 | |
journal fristpage | 120 | |
journal lastpage | 125 | |
identifier eissn | 1043-7398 | |
keywords | Fatigue | |
keywords | Solders | |
keywords | Constitutive equations | |
keywords | Engineering simulation | |
keywords | Finite element analysis | |
keywords | Fatigue life | |
keywords | Solder joints | |
keywords | Alloys | |
keywords | Temperature | |
keywords | Hardening AND Ball-Grid-Array packaging | |
tree | Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001 | |
contenttype | Fulltext | |