contributor author | C. M. Lawrence Wu | |
contributor author | Robert K. Y. Li | |
contributor author | N. H. Yeung | |
date accessioned | 2017-05-09T00:09:56Z | |
date available | 2017-05-09T00:09:56Z | |
date copyright | March, 2003 | |
date issued | 2003 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26212#93_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/128247 | |
description abstract | Isotropic conductive adhesives (ICA) have been considered as replacement materials for lead-tin solder alloys. In this paper, the post-impact shear strength of ICA surface mount (SM) joints was obtained experimentally and compared with that of SM lead-tin joints. The dynamic impact energy was provided in the form of three-point bending on the PCB using equipment called the split Hopkinson bar. Strain rates of over 4000/s were used for the impact bending test. The action of impact bending was used to simulate the effect on the PCB and the interconnection as a result of high energy impact on an electronic equipment. Shear test was then performed to examine the change in strength of the ICA joints as a result of impact damage. It was found that the SM ICA joints failed due to impact at a strain rate just over 4000/s. Microstructural examination carried out using a scanning electron microscope revealed that the interface between the ICA and copper pad on the PCB was the weakest region of the joint. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Impact Resistance of SM Joints Formed With ICA | |
type | Journal Paper | |
journal volume | 125 | |
journal issue | 1 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.1534842 | |
journal fristpage | 93 | |
journal lastpage | 97 | |
identifier eissn | 1043-7398 | |
keywords | Copper | |
keywords | Silver | |
keywords | Alloys | |
keywords | Adhesives | |
keywords | Scanning electron microscopes | |
keywords | Solders | |
keywords | Electrical resistance | |
keywords | Shear (Mechanics) | |
keywords | Shear strength | |
keywords | Surface mount packaging | |
keywords | Fracture (Process) | |
keywords | Resistors | |
keywords | Impact testing | |
keywords | Stress | |
keywords | Reliability | |
keywords | Compression | |
keywords | Electronic equipment | |
keywords | Bonding | |
keywords | Curing | |
keywords | Resins AND Temperature | |
tree | Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001 | |
contenttype | Fulltext | |