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    High Cycle Fatigue Resistance and Reliability Assessment of Flexible Printed Circuitry

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003::page 254
    Author:
    Elena Martynenko
    ,
    Ron S. Li
    ,
    Larry Poglitsch
    ,
    Wen Zhou
    ,
    Alexander Chudnovsky
    DOI: 10.1115/1.1462628
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Flexible printed circuitry (FPC) is a patterned array of conductors supported by a flexible dielectric film made of high strength polymer material such as polyimide. The flexibility of FPC provides an opportunity for three dimensional packaging, easy interconnections and dynamic applications. The polymeric core layer is the primary load bearing structure when the substrate is not supported by a rigid plate. In its composite structure, the conductive layers are more vulnerable to failure due to their lower flexibility compared to the core layer. Fatigue data on FPCs are not commonly available in published literature. Presented in this paper is the fatigue resistance and reliability assessment of polyimide based FPCs. Fatigue resistance of a specific material system was analyzed as a function of temperature and frequency through experiments that utilized a specially designed experimental setup consisting of sine servo controller, electrodynamic shaker, continuity monitor and temperature chamber. The fatigue characteristics of the selected material system are summarized in the form of S-N diagrams. Significant decrease in fatigue lifetime has been observed due to higher displacements in high cycle fatigue. Observed temperature effect was however counter-intuitive. Failure mechanisms are discussed and complete fracture analysis is presented. In various FPC systems, it has been found that the changes take place in FPC failure mechanisms from well-developed and aligned single cracks through the width at low temperature to an array of multiple cracks with random sizes and locations at high temperature.
    keyword(s): Fatigue , Temperature , Electrical resistance , Reliability , Stress , Cycles , Failure , Displacement , Fracture (Process) , Testing , Control equipment AND Servomechanisms ,
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      High Cycle Fatigue Resistance and Reliability Assessment of Flexible Printed Circuitry

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    http://yetl.yabesh.ir/yetl1/handle/yetl/126591
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    contributor authorElena Martynenko
    contributor authorRon S. Li
    contributor authorLarry Poglitsch
    contributor authorWen Zhou
    contributor authorAlexander Chudnovsky
    date accessioned2017-05-09T00:07:10Z
    date available2017-05-09T00:07:10Z
    date copyrightSeptember, 2002
    date issued2002
    identifier issn1528-9044
    identifier otherJEPAE4-26206#254_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126591
    description abstractFlexible printed circuitry (FPC) is a patterned array of conductors supported by a flexible dielectric film made of high strength polymer material such as polyimide. The flexibility of FPC provides an opportunity for three dimensional packaging, easy interconnections and dynamic applications. The polymeric core layer is the primary load bearing structure when the substrate is not supported by a rigid plate. In its composite structure, the conductive layers are more vulnerable to failure due to their lower flexibility compared to the core layer. Fatigue data on FPCs are not commonly available in published literature. Presented in this paper is the fatigue resistance and reliability assessment of polyimide based FPCs. Fatigue resistance of a specific material system was analyzed as a function of temperature and frequency through experiments that utilized a specially designed experimental setup consisting of sine servo controller, electrodynamic shaker, continuity monitor and temperature chamber. The fatigue characteristics of the selected material system are summarized in the form of S-N diagrams. Significant decrease in fatigue lifetime has been observed due to higher displacements in high cycle fatigue. Observed temperature effect was however counter-intuitive. Failure mechanisms are discussed and complete fracture analysis is presented. In various FPC systems, it has been found that the changes take place in FPC failure mechanisms from well-developed and aligned single cracks through the width at low temperature to an array of multiple cracks with random sizes and locations at high temperature.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleHigh Cycle Fatigue Resistance and Reliability Assessment of Flexible Printed Circuitry
    typeJournal Paper
    journal volume124
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1462628
    journal fristpage254
    journal lastpage259
    identifier eissn1043-7398
    keywordsFatigue
    keywordsTemperature
    keywordsElectrical resistance
    keywordsReliability
    keywordsStress
    keywordsCycles
    keywordsFailure
    keywordsDisplacement
    keywordsFracture (Process)
    keywordsTesting
    keywordsControl equipment AND Servomechanisms
    treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian