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contributor authorA. J. Hudson
contributor authorJ. K. Spelt
contributor authorS. C. Martin
contributor authorM. Hubert
date accessioned2017-05-09T00:07:09Z
date available2017-05-09T00:07:09Z
date copyrightDecember, 2002
date issued2002
identifier issn1528-9044
identifier otherJEPAE4-26210#352_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126581
description abstractThis paper describes an optical method that has been developed to accurately measure shrinkage during the cure of adhesives treated with UV light. The experiment was designed to measure changes in the volume of very small quantities of material appropriate to uses in the fiber-optic and micro-electronic industries. A spot-curing device (EFOS Inc.) was used to deliver a controlled exposure of UV-light with a known distribution of wavelengths to the sample. The results indicate that reproducible values for the volumetric shrinkage can be achieved using spot-curing methods. The technique described in this paper, combined with other experimental measurements under development, will assist in the selection of the appropriate adhesive for specific applications and the curing conditions needed to optimize its final properties.
publisherThe American Society of Mechanical Engineers (ASME)
titleOptical Measurements of Shrinkage in UV-Cured Adhesives
typeJournal Paper
journal volume124
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1498264
journal fristpage352
journal lastpage354
identifier eissn1043-7398
keywordsUltraviolet radiation
keywordsAdhesives
keywordsUltraviolet cured adhesives
keywordsShrinkage (Materials)
keywordsCuring
keywordsOptical measurement
keywordsWavelength
keywordsFibers AND Measurement
treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004
contenttypeFulltext


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