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    Strength Evaluation of Notch Structure for Semiconductor Encapsulant Resin

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004::page 323
    Author:
    Noriyasu Kawamura
    ,
    Kikuo Kishimoto
    ,
    Toshikazu Shibuya
    ,
    Masaki Omiya
    ,
    Takashi Kawakami
    DOI: 10.1115/1.1501304
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Plastic encapsulated semiconductor packages may crack at the corner regions of die pads or chips if internal delamination occurs at an elevated temperature during the reflow soldering process. Thus, the structural strength design around the notch structures, which will be formed in the encapsulant resin due to the delamination, is considered one of the most important issues. Especially, it becomes a more critical item of the package development in order to realize the reflow process with lead-free solder materials, whose melting points are higher than that of Sn63-Pb37. In this study, the fracture behavior of notched specimens, which were made of silica particulate-filled epoxy resins and modeled as the corner regions in actual packages, were studied with experimental and numerical analyses. First, the fracture tests of the notch structure of semiconductor encapsulant resin were carried out. A notch tip with several different radii was introduced to the specimen. The specimens were fractured by a three-point bending load. Second, the strength evaluation of the notch structure was carried out. The critical stress distribution σC(r)=max.[KIC/(2πr)1/2,σB] was used to determine the crack initiation at the notch tip. It is assumed that a fracture occurs when, at any point near the notch tip, the stress distribution exceeds the critical stress distribution determined by fracture toughness and bending strength. Three-dimensional finite element analysis was carried out to obtain the stress distributions around the notch tip in the specimen. The calculated stress distributions around the notch tip were compared with the critical stress distribution to estimate the fracture load of the specimen. Estimated fracture loads at room temperature and at high temperature were compared with the results of the fracture tests. It was confirmed that the predicted results based on the critical stress distribution corresponded very well with the experimental results. The validity of the criterion was confirmed by studying the fracture behavior of the notched specimens of actual silica particulate filled epoxy resins.
    keyword(s): Semiconductors (Materials) , Fracture (Process) , Resins , Temperature , Stress , Fracture toughness , Bending strength , Stress concentration , Epoxy resins AND Particulate matter ,
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      Strength Evaluation of Notch Structure for Semiconductor Encapsulant Resin

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    http://yetl.yabesh.ir/yetl1/handle/yetl/126575
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    • Journal of Electronic Packaging

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    contributor authorNoriyasu Kawamura
    contributor authorKikuo Kishimoto
    contributor authorToshikazu Shibuya
    contributor authorMasaki Omiya
    contributor authorTakashi Kawakami
    date accessioned2017-05-09T00:07:08Z
    date available2017-05-09T00:07:08Z
    date copyrightDecember, 2002
    date issued2002
    identifier issn1528-9044
    identifier otherJEPAE4-26210#323_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126575
    description abstractPlastic encapsulated semiconductor packages may crack at the corner regions of die pads or chips if internal delamination occurs at an elevated temperature during the reflow soldering process. Thus, the structural strength design around the notch structures, which will be formed in the encapsulant resin due to the delamination, is considered one of the most important issues. Especially, it becomes a more critical item of the package development in order to realize the reflow process with lead-free solder materials, whose melting points are higher than that of Sn63-Pb37. In this study, the fracture behavior of notched specimens, which were made of silica particulate-filled epoxy resins and modeled as the corner regions in actual packages, were studied with experimental and numerical analyses. First, the fracture tests of the notch structure of semiconductor encapsulant resin were carried out. A notch tip with several different radii was introduced to the specimen. The specimens were fractured by a three-point bending load. Second, the strength evaluation of the notch structure was carried out. The critical stress distribution σC(r)=max.[KIC/(2πr)1/2,σB] was used to determine the crack initiation at the notch tip. It is assumed that a fracture occurs when, at any point near the notch tip, the stress distribution exceeds the critical stress distribution determined by fracture toughness and bending strength. Three-dimensional finite element analysis was carried out to obtain the stress distributions around the notch tip in the specimen. The calculated stress distributions around the notch tip were compared with the critical stress distribution to estimate the fracture load of the specimen. Estimated fracture loads at room temperature and at high temperature were compared with the results of the fracture tests. It was confirmed that the predicted results based on the critical stress distribution corresponded very well with the experimental results. The validity of the criterion was confirmed by studying the fracture behavior of the notched specimens of actual silica particulate filled epoxy resins.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleStrength Evaluation of Notch Structure for Semiconductor Encapsulant Resin
    typeJournal Paper
    journal volume124
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1501304
    journal fristpage323
    journal lastpage327
    identifier eissn1043-7398
    keywordsSemiconductors (Materials)
    keywordsFracture (Process)
    keywordsResins
    keywordsTemperature
    keywordsStress
    keywordsFracture toughness
    keywordsBending strength
    keywordsStress concentration
    keywordsEpoxy resins AND Particulate matter
    treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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