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    Surface Steps: From Atomistics to Continuum

    Source: Journal of Applied Mechanics:;2002:;volume( 069 ):;issue: 004::page 443
    Author:
    R. Kukta
    ,
    Assoc. Mem. ASME
    ,
    A. Peralta
    ,
    Assoc. Mem. ASME
    ,
    D. Kouris
    DOI: 10.1115/1.1468999
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The elastic interaction between surface steps biases growth and can have a dominant influence on growth modes of thin films. A new continuum solution is presented that takes into account the actual geometry of the steps. It is shown that even in the absence of external stress, the interaction energy contains a logarithmic dependence not previously reported in the literature. This additional term is of the same order of magnitude as the ones contained in the solution of Marchenko and Parshin that has been generally used during the past twenty years. Opposite and similar steps are investigated and closed-form expressions for the relevant elastic fields and interaction energies are derived. Results compare favorably with the ones obtained from embedded atom method (EAM) simulations and a recent elastic lattice model.
    keyword(s): Stress , Engineering simulation , Geometry , Thin films AND Atoms ,
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      Surface Steps: From Atomistics to Continuum

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    http://yetl.yabesh.ir/yetl1/handle/yetl/126258
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    contributor authorR. Kukta
    contributor authorAssoc. Mem. ASME
    contributor authorA. Peralta
    contributor authorAssoc. Mem. ASME
    contributor authorD. Kouris
    date accessioned2017-05-09T00:06:37Z
    date available2017-05-09T00:06:37Z
    date copyrightJuly, 2002
    date issued2002
    identifier issn0021-8936
    identifier otherJAMCAV-26539#443_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126258
    description abstractThe elastic interaction between surface steps biases growth and can have a dominant influence on growth modes of thin films. A new continuum solution is presented that takes into account the actual geometry of the steps. It is shown that even in the absence of external stress, the interaction energy contains a logarithmic dependence not previously reported in the literature. This additional term is of the same order of magnitude as the ones contained in the solution of Marchenko and Parshin that has been generally used during the past twenty years. Opposite and similar steps are investigated and closed-form expressions for the relevant elastic fields and interaction energies are derived. Results compare favorably with the ones obtained from embedded atom method (EAM) simulations and a recent elastic lattice model.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleSurface Steps: From Atomistics to Continuum
    typeJournal Paper
    journal volume69
    journal issue4
    journal titleJournal of Applied Mechanics
    identifier doi10.1115/1.1468999
    journal fristpage443
    journal lastpage450
    identifier eissn1528-9036
    keywordsStress
    keywordsEngineering simulation
    keywordsGeometry
    keywordsThin films AND Atoms
    treeJournal of Applied Mechanics:;2002:;volume( 069 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian