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    A Numerical Model to Predict the Thermal and Psychrometric Response of Electronic Packages

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 003::page 200
    Author:
    J. V. C. Vargas
    ,
    M. C. Campos
    ,
    G. Stanescu
    ,
    R. Florea
    DOI: 10.1115/1.1348337
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper introduces a general computational model for electronic packages, e.g., cabinets that contain electronic equipment. A simplified physical model, which combines principles of classical thermodynamics and heat transfer, is developed and the resulting three-dimensional differential equations are discretized in space using a three-dimensional cell centered finite volume scheme. Therefore, the combination of the proposed simplified physical model with the adopted finite volume scheme for the numerical discretization of the differential equations is called a volume element model (VEM). A typical cabinet was built in the laboratory, and two different experimental conditions were tested, measuring the temperatures at forty-six internal points. The proposed model was utilized to simulate numerically the behavior of the cabinet operating under the same experimental conditions. Mesh refinements were conducted to ensure the convergence of the numerical results. The converged mesh was relatively coarse (504 cells), therefore the solutions were obtained with low computational time. The model temperature results were directly compared to the steady-state experimental measurements of the forty-six internal points, with good quantitative and qualitative agreement. Since accuracy and low computational time are combined, the model is shown to be efficient and could be used as a tool for simulation, design, and optimization of electronic packages.
    keyword(s): Heat , Temperature , Electronic packages , Optimization , Heat transfer , Computer simulation , Heat flux AND Electronic equipment ,
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      A Numerical Model to Predict the Thermal and Psychrometric Response of Electronic Packages

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    http://yetl.yabesh.ir/yetl1/handle/yetl/125029
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    contributor authorJ. V. C. Vargas
    contributor authorM. C. Campos
    contributor authorG. Stanescu
    contributor authorR. Florea
    date accessioned2017-05-09T00:04:35Z
    date available2017-05-09T00:04:35Z
    date copyrightSeptember, 2001
    date issued2001
    identifier issn1528-9044
    identifier otherJEPAE4-26195#200_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/125029
    description abstractThis paper introduces a general computational model for electronic packages, e.g., cabinets that contain electronic equipment. A simplified physical model, which combines principles of classical thermodynamics and heat transfer, is developed and the resulting three-dimensional differential equations are discretized in space using a three-dimensional cell centered finite volume scheme. Therefore, the combination of the proposed simplified physical model with the adopted finite volume scheme for the numerical discretization of the differential equations is called a volume element model (VEM). A typical cabinet was built in the laboratory, and two different experimental conditions were tested, measuring the temperatures at forty-six internal points. The proposed model was utilized to simulate numerically the behavior of the cabinet operating under the same experimental conditions. Mesh refinements were conducted to ensure the convergence of the numerical results. The converged mesh was relatively coarse (504 cells), therefore the solutions were obtained with low computational time. The model temperature results were directly compared to the steady-state experimental measurements of the forty-six internal points, with good quantitative and qualitative agreement. Since accuracy and low computational time are combined, the model is shown to be efficient and could be used as a tool for simulation, design, and optimization of electronic packages.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Numerical Model to Predict the Thermal and Psychrometric Response of Electronic Packages
    typeJournal Paper
    journal volume123
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1348337
    journal fristpage200
    journal lastpage210
    identifier eissn1043-7398
    keywordsHeat
    keywordsTemperature
    keywordsElectronic packages
    keywordsOptimization
    keywordsHeat transfer
    keywordsComputer simulation
    keywordsHeat flux AND Electronic equipment
    treeJournal of Electronic Packaging:;2001:;volume( 123 ):;issue: 003
    contenttypeFulltext
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    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian