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contributor authorJ. Z. Shi
contributor authorF. Stubhan
contributor authorJ. Freytag
contributor authorX. M. Xie
date accessioned2017-05-09T00:02:12Z
date available2017-05-09T00:02:12Z
date copyrightJune, 2000
date issued2000
identifier issn1528-9044
identifier otherJEPAE4-26181#168_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123564
description abstractA novel two-step process based on isothermal solidification is developed for die attachment of ceramic package. With a simple design of the multilayer system, silicon chip could be bonded onto the allumina substrate in between 200°C and 300°C. The total process time is less than 15 seconds during which the actual assembly time is within one second. Most of the samples can pass the shear strength test specified by MIL STD 883D. All the samples could pass 1750 cycles between −55°C and 125°C with slight degradation in die shear strength after the test. The microstructures of the bonds are characterized with metallographical investigation. Comparisons are made between the present technique and the Au/Si eutectic bonding. [S1043-7398(00)01202-0]
publisherThe American Society of Mechanical Engineers (ASME)
titleA Novel High Performance Die Attach for Ceramic Packages
typeJournal Paper
journal volume122
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.483150
journal fristpage168
journal lastpage171
identifier eissn1043-7398
keywordsTemperature
keywordsCeramics
keywordsBonding
keywordsCycles
keywordsProject tasks
keywordsSolidification
keywordsShear strength AND Silicon chips
treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 002
contenttypeFulltext


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