Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide BreakdownSource: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 002::page 126DOI: 10.1115/1.2792667Publisher: The American Society of Mechanical Engineers (ASME)keyword(s): Liquid crystals AND Failure analysis ,
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| contributor author | T. J. Dishoungh | |
| contributor author | J. Wyler | |
| contributor author | M. Dube | |
| contributor author | M. Pecht | |
| date accessioned | 2017-05-08T23:59:22Z | |
| date available | 2017-05-08T23:59:22Z | |
| date copyright | June, 1999 | |
| date issued | 1999 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26173#126_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/122005 | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide Breakdown | |
| type | Journal Paper | |
| journal volume | 121 | |
| journal issue | 2 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.2792667 | |
| journal fristpage | 126 | |
| journal lastpage | 127 | |
| identifier eissn | 1043-7398 | |
| keywords | Liquid crystals AND Failure analysis | |
| tree | Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 002 | |
| contenttype | Fulltext |