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    J-Lead Solder Joint Thermal Fatigue Life Model

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 003::page 186
    Author:
    T. E. Wong
    ,
    L. A. Kachatorian
    ,
    H. M. Cohen
    DOI: 10.1115/1.2792682
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A thermal fatigue life prediction model of J-lead solder joint assembly has been developed. This model is evolved from an empirically derived formula based on modified Manson-Coffin fatigue life Prediction theory. To estimate solder joint fatigue life, nonlinear finite element analysis (FEA) was conducted using the ABAQUS™ computer code. The analysis results show that cracks are initiated and propagated from both the heel and the toe of the solder joint toward the center portion of the joint. This condition results in the solder joint fatigue life degradation and is included in the model development. The fatigue life prediction model is then calibrated to life cycling test results, which were provided by Jet Propulsion Laboratory (JPL/NASA). The developed life prediction model, combined with the nonelastic strains derived from FEA and Miner’s cumulative damage law, was used to predict the cumulative damage index of the solder joint under NASA’s thermal cycling environment (between −55°C and 100°C). The analysis results indicate that this solder joint has a 50 percent failure probability when the solder joint is exposed up to 5206 thermal cycles. To shorten the test time, a modified thermal cycling profile was proposed. This profile is the same as the NASA thermal cycling environment except using the high end of the dwell temperature at 125°C. The analysis results show that a 50 percent failure probability of the solder joint would occur after the solder joint is exposed to 3500 cycles of the NASA thermal environment and followed by 1063 cycles of the modified thermal profile. In conclusion, the developed life prediction model is recommended to serve as an effective tool to integrate the process of design selection, quality inspection, and qualification testing in a concurrent engineering process. It is also recommended to conduct a micro-section in the solder joint to verify the solder crack paths and further validate the life prediction model. When additional thermal cycles have been added into the test specimens, recalibrating this model by test is also recommended.
    keyword(s): Fatigue life , Solder joints , Cycles , Finite element analysis , Fracture (Materials) , Failure , Probability , Formulas , Model development , Prediction theory , Design , Testing , Computers , Temperature , Inspection , Solders , Manufacturing , Concurrent engineering AND Jet propulsion ,
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      J-Lead Solder Joint Thermal Fatigue Life Model

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    http://yetl.yabesh.ir/yetl1/handle/yetl/121999
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    • Journal of Electronic Packaging

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    contributor authorT. E. Wong
    contributor authorL. A. Kachatorian
    contributor authorH. M. Cohen
    date accessioned2017-05-08T23:59:21Z
    date available2017-05-08T23:59:21Z
    date copyrightSeptember, 1999
    date issued1999
    identifier issn1528-9044
    identifier otherJEPAE4-26174#186_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/121999
    description abstractA thermal fatigue life prediction model of J-lead solder joint assembly has been developed. This model is evolved from an empirically derived formula based on modified Manson-Coffin fatigue life Prediction theory. To estimate solder joint fatigue life, nonlinear finite element analysis (FEA) was conducted using the ABAQUS™ computer code. The analysis results show that cracks are initiated and propagated from both the heel and the toe of the solder joint toward the center portion of the joint. This condition results in the solder joint fatigue life degradation and is included in the model development. The fatigue life prediction model is then calibrated to life cycling test results, which were provided by Jet Propulsion Laboratory (JPL/NASA). The developed life prediction model, combined with the nonelastic strains derived from FEA and Miner’s cumulative damage law, was used to predict the cumulative damage index of the solder joint under NASA’s thermal cycling environment (between −55°C and 100°C). The analysis results indicate that this solder joint has a 50 percent failure probability when the solder joint is exposed up to 5206 thermal cycles. To shorten the test time, a modified thermal cycling profile was proposed. This profile is the same as the NASA thermal cycling environment except using the high end of the dwell temperature at 125°C. The analysis results show that a 50 percent failure probability of the solder joint would occur after the solder joint is exposed to 3500 cycles of the NASA thermal environment and followed by 1063 cycles of the modified thermal profile. In conclusion, the developed life prediction model is recommended to serve as an effective tool to integrate the process of design selection, quality inspection, and qualification testing in a concurrent engineering process. It is also recommended to conduct a micro-section in the solder joint to verify the solder crack paths and further validate the life prediction model. When additional thermal cycles have been added into the test specimens, recalibrating this model by test is also recommended.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleJ-Lead Solder Joint Thermal Fatigue Life Model
    typeJournal Paper
    journal volume121
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792682
    journal fristpage186
    journal lastpage190
    identifier eissn1043-7398
    keywordsFatigue life
    keywordsSolder joints
    keywordsCycles
    keywordsFinite element analysis
    keywordsFracture (Materials)
    keywordsFailure
    keywordsProbability
    keywordsFormulas
    keywordsModel development
    keywordsPrediction theory
    keywordsDesign
    keywordsTesting
    keywordsComputers
    keywordsTemperature
    keywordsInspection
    keywordsSolders
    keywordsManufacturing
    keywordsConcurrent engineering AND Jet propulsion
    treeJournal of Electronic Packaging:;1999:;volume( 121 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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