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    Alternative Curing Methods for FCOB Underfill

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 004::page 249
    Author:
    M. M. Merton
    ,
    C. P. Malhotra
    ,
    N. Nikmanesh
    ,
    R. L. Mahajan
    DOI: 10.1115/1.2793848
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper explores the use of liquid immersion and vapor condensation curing as alternatives to conventional hot air oven curing of flip chip on board underfill. Heat transfer results suggest that both the liquid immersion and vapor condensation heating result in reduced cure times due to higher heat transfer results associated with these two techniques. Preliminary reliability studies Suggest that the two proposed rapid curing methods do not result in any increased failure rates or different failure mechanisms. In almost all the samples the failure mode was delamination of the underfill followed by solder fatigue failure.
    keyword(s): Curing , Failure , Condensation , Heat transfer , Vapors , Solders , Reliability , Failure mechanisms , Ovens , Heating , Delamination , Fatigue failure AND Flip-chip ,
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      Alternative Curing Methods for FCOB Underfill

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/121981
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    contributor authorM. M. Merton
    contributor authorC. P. Malhotra
    contributor authorN. Nikmanesh
    contributor authorR. L. Mahajan
    date accessioned2017-05-08T23:59:20Z
    date available2017-05-08T23:59:20Z
    date copyrightDecember, 1999
    date issued1999
    identifier issn1528-9044
    identifier otherJEPAE4-26175#249_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/121981
    description abstractThis paper explores the use of liquid immersion and vapor condensation curing as alternatives to conventional hot air oven curing of flip chip on board underfill. Heat transfer results suggest that both the liquid immersion and vapor condensation heating result in reduced cure times due to higher heat transfer results associated with these two techniques. Preliminary reliability studies Suggest that the two proposed rapid curing methods do not result in any increased failure rates or different failure mechanisms. In almost all the samples the failure mode was delamination of the underfill followed by solder fatigue failure.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAlternative Curing Methods for FCOB Underfill
    typeJournal Paper
    journal volume121
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2793848
    journal fristpage249
    journal lastpage254
    identifier eissn1043-7398
    keywordsCuring
    keywordsFailure
    keywordsCondensation
    keywordsHeat transfer
    keywordsVapors
    keywordsSolders
    keywordsReliability
    keywordsFailure mechanisms
    keywordsOvens
    keywordsHeating
    keywordsDelamination
    keywordsFatigue failure AND Flip-chip
    treeJournal of Electronic Packaging:;1999:;volume( 121 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian