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    Thermomechanical Durability Analysis of Flip Chip Solder Interconnects: Part 2—With Underfill

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 004::page 237
    Author:
    K. Darbha
    ,
    T. Reinikainen
    ,
    J. F. J. M. Caers
    ,
    J. Zhu
    ,
    J. H. Okura
    ,
    S. Shetty
    ,
    A. Dasgupta
    DOI: 10.1115/1.2793846
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The effect of underfill material on reliability of flip chip on board (FCOB) assemblies is investigated in this study by using two-dimensional and three-dimensional finite element simulations under thermal cycling stresses from −55°C to 80°C. Accelerated testing of FCOB conducted by the authors reveals that the presence of underfill can increase the fatigue durability of solder interconnects by two orders of magnitude. Similar data has been extensively reported in the literature. It is the intent of this paper to develop a generic and fundamental predictive model that explains this trend. While empirical models have been reported by other investigators based on experimental data, the main drawback is that many of these empirical models are not truly predictive, and can not be applied to different flip chip architectures using different underfills. In the proposed model, the energy-partitioning (EP) damage model is enhanced in order to capture the underlying mechanisms so that a predictive capability can be developed. A two-dimensional finite element model is developed for stress analysis. This model accounts for underfill over regions of solder in an approximate manner by using overlay elements, and is calibrated using a three-dimensional finite element model. The model constant for the enhanced EP model is derived by fitting model predictions (combination of two-dimensional and three-dimensional model results) to experimental results for a given temperature history. The accuracy of the enhanced EP model is then verified for a different loading profile. The modeling not only reveals the influence of underfill material on solder joint durability, but also provides the acceleration factor to assess durability under life cycle environment, from accelerated test results. Experimental results are used to validate the trends predicted by the analytical model. The final goal is to define the optimum design and process parameters of the underfill material in FCOB assemblies in order to extend the fatigue endurance of the solder joints under cyclic thermal loading environments.
    keyword(s): Solders , Durability , Flip-chip , Solder joints , Fatigue , Finite element model , Fittings , Temperature , Three-dimensional models , Mechanisms , Engineering simulation , Finite element analysis , Modeling , Testing , Architecture , Cycles , Reliability , Overlays (Materials engineering) , Stress , Stress analysis (Engineering) AND Design ,
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      Thermomechanical Durability Analysis of Flip Chip Solder Interconnects: Part 2—With Underfill

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/121978
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    • Journal of Electronic Packaging

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    contributor authorK. Darbha
    contributor authorT. Reinikainen
    contributor authorJ. F. J. M. Caers
    contributor authorJ. Zhu
    contributor authorJ. H. Okura
    contributor authorS. Shetty
    contributor authorA. Dasgupta
    date accessioned2017-05-08T23:59:19Z
    date available2017-05-08T23:59:19Z
    date copyrightDecember, 1999
    date issued1999
    identifier issn1528-9044
    identifier otherJEPAE4-26175#237_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/121978
    description abstractThe effect of underfill material on reliability of flip chip on board (FCOB) assemblies is investigated in this study by using two-dimensional and three-dimensional finite element simulations under thermal cycling stresses from −55°C to 80°C. Accelerated testing of FCOB conducted by the authors reveals that the presence of underfill can increase the fatigue durability of solder interconnects by two orders of magnitude. Similar data has been extensively reported in the literature. It is the intent of this paper to develop a generic and fundamental predictive model that explains this trend. While empirical models have been reported by other investigators based on experimental data, the main drawback is that many of these empirical models are not truly predictive, and can not be applied to different flip chip architectures using different underfills. In the proposed model, the energy-partitioning (EP) damage model is enhanced in order to capture the underlying mechanisms so that a predictive capability can be developed. A two-dimensional finite element model is developed for stress analysis. This model accounts for underfill over regions of solder in an approximate manner by using overlay elements, and is calibrated using a three-dimensional finite element model. The model constant for the enhanced EP model is derived by fitting model predictions (combination of two-dimensional and three-dimensional model results) to experimental results for a given temperature history. The accuracy of the enhanced EP model is then verified for a different loading profile. The modeling not only reveals the influence of underfill material on solder joint durability, but also provides the acceleration factor to assess durability under life cycle environment, from accelerated test results. Experimental results are used to validate the trends predicted by the analytical model. The final goal is to define the optimum design and process parameters of the underfill material in FCOB assemblies in order to extend the fatigue endurance of the solder joints under cyclic thermal loading environments.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermomechanical Durability Analysis of Flip Chip Solder Interconnects: Part 2—With Underfill
    typeJournal Paper
    journal volume121
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2793846
    journal fristpage237
    journal lastpage241
    identifier eissn1043-7398
    keywordsSolders
    keywordsDurability
    keywordsFlip-chip
    keywordsSolder joints
    keywordsFatigue
    keywordsFinite element model
    keywordsFittings
    keywordsTemperature
    keywordsThree-dimensional models
    keywordsMechanisms
    keywordsEngineering simulation
    keywordsFinite element analysis
    keywordsModeling
    keywordsTesting
    keywordsArchitecture
    keywordsCycles
    keywordsReliability
    keywordsOverlays (Materials engineering)
    keywordsStress
    keywordsStress analysis (Engineering) AND Design
    treeJournal of Electronic Packaging:;1999:;volume( 121 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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