contributor author | X. Yan | |
contributor author | R. K. Agarwal | |
date accessioned | 2017-05-08T23:56:17Z | |
date available | 2017-05-08T23:56:17Z | |
date copyright | June, 1998 | |
date issued | 1998 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26166#150_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/120265 | |
description abstract | Two test specimens are developed to measure interfacial fracture toughness in flip-chip assemblies. The specimens consist of three layers: silicon chip, underfill, and circuit board. Two symmetric edge cracks are embedded along the interface, either between the chip and the underfill or between the underfill and the circuit board. The specimens are subjected to four-point-bend loading and critical loads are obtained. Analytical solutions for energy release rate have been derived for these two specimens and used to obtain the toughness from the measured critical loads. These specimens have been used to evaluate material combinations of chip passivation, underfill and solder mask for desired interfacial strength. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Two Test Specimens for Determining the Interfacial Fracture Toughness in Flip-Chip Assemblies | |
type | Journal Paper | |
journal volume | 120 | |
journal issue | 2 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.2792607 | |
journal fristpage | 150 | |
journal lastpage | 155 | |
identifier eissn | 1043-7398 | |
keywords | Fracture toughness | |
keywords | Flip-chip assemblies | |
keywords | Stress | |
keywords | Circuits | |
keywords | Solders | |
keywords | Silicon chips | |
keywords | Fracture (Materials) | |
keywords | Masks AND Toughness | |
tree | Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 002 | |
contenttype | Fulltext | |