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    A Thermo-Mechanical Approach for Fatigue Testing of Polymer Bimaterial Interfaces

    Source: Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 004::page 372
    Author:
    C. K. Gurumurthy
    ,
    C.-Y. Hui
    ,
    E. J. Kramer
    ,
    J. Jiao
    ,
    L. G. Norris
    DOI: 10.1115/1.2792649
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: We have developed a new technique that uses a noncontact fiber optic displacement sensor to investigate the crack growth along polymer interfaces under thermal fatigue conditions. This technique has been used to test the underfill/passivation interface of a direct chip attach (DCA) assembly, the thermal fatigue driven delamination of which is a major cause for failure of DCA assemblies. The sample is prepared as a multilayered cantilever beam by capillary flow of the underfill over a polyimide coated metallic beam. During thermal cycling the crack growth along the interface from the free end changes the displacement of this end of the beam and we measure this displacement at the lowest temperature in each thermal cycle. The change in beam displacement is converted into crack growth knowing the geometry of the specimen. The crack growth rate depends on the maximum difference in the strain energy release rate of the crack in each cycle and the mechanical phase angle. This paper outlines the theoretical basis of the technique and provides initial results obtained for a variety of underfills dispensed over a commercial (PMDA/ODA) polyimide. The technique was validated by comparing the crack growth measured by displacement changes with direct optical microscopy measurements of the crack length.
    keyword(s): Polymers , Fatigue testing , Fracture (Materials) , Displacement , Cycles , Fatigue , Temperature , Fibers , Measurement , Sensors , Cantilever beams , Manufacturing , Flow (Dynamics) , Failure , Geometry , Optical microscopy AND Delamination ,
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      A Thermo-Mechanical Approach for Fatigue Testing of Polymer Bimaterial Interfaces

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    http://yetl.yabesh.ir/yetl1/handle/yetl/120236
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    contributor authorC. K. Gurumurthy
    contributor authorC.-Y. Hui
    contributor authorE. J. Kramer
    contributor authorJ. Jiao
    contributor authorL. G. Norris
    date accessioned2017-05-08T23:56:14Z
    date available2017-05-08T23:56:14Z
    date copyrightDecember, 1998
    date issued1998
    identifier issn1528-9044
    identifier otherJEPAE4-26169#372_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/120236
    description abstractWe have developed a new technique that uses a noncontact fiber optic displacement sensor to investigate the crack growth along polymer interfaces under thermal fatigue conditions. This technique has been used to test the underfill/passivation interface of a direct chip attach (DCA) assembly, the thermal fatigue driven delamination of which is a major cause for failure of DCA assemblies. The sample is prepared as a multilayered cantilever beam by capillary flow of the underfill over a polyimide coated metallic beam. During thermal cycling the crack growth along the interface from the free end changes the displacement of this end of the beam and we measure this displacement at the lowest temperature in each thermal cycle. The change in beam displacement is converted into crack growth knowing the geometry of the specimen. The crack growth rate depends on the maximum difference in the strain energy release rate of the crack in each cycle and the mechanical phase angle. This paper outlines the theoretical basis of the technique and provides initial results obtained for a variety of underfills dispensed over a commercial (PMDA/ODA) polyimide. The technique was validated by comparing the crack growth measured by displacement changes with direct optical microscopy measurements of the crack length.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Thermo-Mechanical Approach for Fatigue Testing of Polymer Bimaterial Interfaces
    typeJournal Paper
    journal volume120
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792649
    journal fristpage372
    journal lastpage378
    identifier eissn1043-7398
    keywordsPolymers
    keywordsFatigue testing
    keywordsFracture (Materials)
    keywordsDisplacement
    keywordsCycles
    keywordsFatigue
    keywordsTemperature
    keywordsFibers
    keywordsMeasurement
    keywordsSensors
    keywordsCantilever beams
    keywordsManufacturing
    keywordsFlow (Dynamics)
    keywordsFailure
    keywordsGeometry
    keywordsOptical microscopy AND Delamination
    treeJournal of Electronic Packaging:;1998:;volume( 120 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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