contributor author | Daping Yao | |
contributor author | Z. Zhang | |
contributor author | J. K. Shang | |
date accessioned | 2017-05-08T23:49:49Z | |
date available | 2017-05-08T23:49:49Z | |
date copyright | June, 1996 | |
date issued | 1996 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26154#45_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/116785 | |
description abstract | Failures of solder joints often result from development of cracks under complex mixed-mode loading conditions. In this study, a flexural peel technique was developed to investigate the growth of cracks at the interface between solder and Cu substrate. The technique was based on a tri-layer solder/Cu joints, with the solder layer sand-wiched between two Cu layers of desired thicknesses. Finite element analysis was used to calculate the mixed-mode condition at the crack tip as a function of the thicknesses of Cu outerlayers and the solder interlayer. The application of this technique to studying interface crack growth under fatigue loading is demonstrated for eutectic solder joints. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | An Experimental Technique for Studying Mixed-Mode Fatigue Crack Growth in Solder Joints | |
type | Journal Paper | |
journal volume | 118 | |
journal issue | 2 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.2792130 | |
journal fristpage | 45 | |
journal lastpage | 48 | |
identifier eissn | 1043-7398 | |
keywords | Fatigue cracks | |
keywords | Solder joints | |
keywords | Solders | |
keywords | Fracture (Materials) | |
keywords | Finite element analysis | |
keywords | Failure | |
keywords | Fatigue AND Sands | |
tree | Journal of Electronic Packaging:;1996:;volume( 118 ):;issue: 002 | |
contenttype | Fulltext | |