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    An Experimental Technique for Studying Mixed-Mode Fatigue Crack Growth in Solder Joints

    Source: Journal of Electronic Packaging:;1996:;volume( 118 ):;issue: 002::page 45
    Author:
    Daping Yao
    ,
    Z. Zhang
    ,
    J. K. Shang
    DOI: 10.1115/1.2792130
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Failures of solder joints often result from development of cracks under complex mixed-mode loading conditions. In this study, a flexural peel technique was developed to investigate the growth of cracks at the interface between solder and Cu substrate. The technique was based on a tri-layer solder/Cu joints, with the solder layer sand-wiched between two Cu layers of desired thicknesses. Finite element analysis was used to calculate the mixed-mode condition at the crack tip as a function of the thicknesses of Cu outerlayers and the solder interlayer. The application of this technique to studying interface crack growth under fatigue loading is demonstrated for eutectic solder joints.
    keyword(s): Fatigue cracks , Solder joints , Solders , Fracture (Materials) , Finite element analysis , Failure , Fatigue AND Sands ,
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      An Experimental Technique for Studying Mixed-Mode Fatigue Crack Growth in Solder Joints

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/116785
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    • Journal of Electronic Packaging

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    contributor authorDaping Yao
    contributor authorZ. Zhang
    contributor authorJ. K. Shang
    date accessioned2017-05-08T23:49:49Z
    date available2017-05-08T23:49:49Z
    date copyrightJune, 1996
    date issued1996
    identifier issn1528-9044
    identifier otherJEPAE4-26154#45_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/116785
    description abstractFailures of solder joints often result from development of cracks under complex mixed-mode loading conditions. In this study, a flexural peel technique was developed to investigate the growth of cracks at the interface between solder and Cu substrate. The technique was based on a tri-layer solder/Cu joints, with the solder layer sand-wiched between two Cu layers of desired thicknesses. Finite element analysis was used to calculate the mixed-mode condition at the crack tip as a function of the thicknesses of Cu outerlayers and the solder interlayer. The application of this technique to studying interface crack growth under fatigue loading is demonstrated for eutectic solder joints.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAn Experimental Technique for Studying Mixed-Mode Fatigue Crack Growth in Solder Joints
    typeJournal Paper
    journal volume118
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792130
    journal fristpage45
    journal lastpage48
    identifier eissn1043-7398
    keywordsFatigue cracks
    keywordsSolder joints
    keywordsSolders
    keywordsFracture (Materials)
    keywordsFinite element analysis
    keywordsFailure
    keywordsFatigue AND Sands
    treeJournal of Electronic Packaging:;1996:;volume( 118 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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