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    Reliability Issues in Plated-Through-Holes Due to Insertion-Mount Compliant-Pin Connectors

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002::page 147
    Author:
    G. Ganguly
    ,
    A. Dasgupta
    DOI: 10.1115/1.2792082
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Stresses arising in plated through holes (PTHs) and surrounding printed wiring board (PWB) substrates due to pin forces of insertion-mount compliant-pin connectors are modeled analytically. The analytical model is based on separation of variable techniques using Fourier series representation of the pin loads, and will be calibrated in the future using both experimental measurements as well as numerical finite element results. Linear and nonlinear results are presented in this paper, to predict deformation and stresses in the assembly. Incremental load-stepping methods are used, to handle nonlinear material properties such as elastic-plastic behavior of copper and post-damage behavior of the PWB substrate. The nonlinearity of the materials is modeled with a simplified bilinear stress-strain curve. The goal is to develop mechanistic predictive models for PTH behavior under insertion forces of compliant pins, to reduce the need for highly repetitive and costly failure analysis for damage evaluation, resulting in significant cost savings to the industry as a whole.
    keyword(s): Force , Deformation , Separation (Technology) , Copper , Measurement , Manufacturing , Reliability , Stress , Pins (Engineering) , Stress-strain curves , Materials properties , Finite element analysis , Failure analysis , Fourier series AND Printed circuit boards ,
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      Reliability Issues in Plated-Through-Holes Due to Insertion-Mount Compliant-Pin Connectors

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/115163
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    contributor authorG. Ganguly
    contributor authorA. Dasgupta
    date accessioned2017-05-08T23:46:55Z
    date available2017-05-08T23:46:55Z
    date copyrightJune, 1995
    date issued1995
    identifier issn1528-9044
    identifier otherJEPAE4-26149#147_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/115163
    description abstractStresses arising in plated through holes (PTHs) and surrounding printed wiring board (PWB) substrates due to pin forces of insertion-mount compliant-pin connectors are modeled analytically. The analytical model is based on separation of variable techniques using Fourier series representation of the pin loads, and will be calibrated in the future using both experimental measurements as well as numerical finite element results. Linear and nonlinear results are presented in this paper, to predict deformation and stresses in the assembly. Incremental load-stepping methods are used, to handle nonlinear material properties such as elastic-plastic behavior of copper and post-damage behavior of the PWB substrate. The nonlinearity of the materials is modeled with a simplified bilinear stress-strain curve. The goal is to develop mechanistic predictive models for PTH behavior under insertion forces of compliant pins, to reduce the need for highly repetitive and costly failure analysis for damage evaluation, resulting in significant cost savings to the industry as a whole.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleReliability Issues in Plated-Through-Holes Due to Insertion-Mount Compliant-Pin Connectors
    typeJournal Paper
    journal volume117
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792082
    journal fristpage147
    journal lastpage152
    identifier eissn1043-7398
    keywordsForce
    keywordsDeformation
    keywordsSeparation (Technology)
    keywordsCopper
    keywordsMeasurement
    keywordsManufacturing
    keywordsReliability
    keywordsStress
    keywordsPins (Engineering)
    keywordsStress-strain curves
    keywordsMaterials properties
    keywordsFinite element analysis
    keywordsFailure analysis
    keywordsFourier series AND Printed circuit boards
    treeJournal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002
    contenttypeFulltext
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