Plastic Deformation Kinetics of 95.5Sn4Cu0.5Ag Solder JointsSource: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002::page 100DOI: 10.1115/1.2792074Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The plastic deformation kinetics of 95.5Sn4Cu0.5Ag solder joints were determined in monotonic loading shear over the temperature range of 25°–150°C using three types of tests: (a) constant shear rate, (b) constant shear stress (creep), and (c) differential tests (changes in shear rate or temperature during an otherwise isothermal constant shear rate test). The deformation kinetics were evaluated in terms of the Dorn high temperature plastic deformation equation γ̇p = A(μb/kT) D(b/d)P (τ/μ)n where γ̇p is the shear rate, μ the shear modulus, b the Burgers vector, D the appropriate diffusion coefficient, d the grain size and τ the shear stress. A, p, and n are constants whose values depend on the rate controlling mechanism. It was found that n increased with stress from ~4 at 2 MPa to ~20 at 25 MPa, relatively independent of temperature. The activation ΔH was determined to be 21.1 ± 2 kcal/mole. The constant A, however, decreased with temperature from a value of ~1018 at 25°C to ~1010 at 150°C. The values of n and ΔH suggest that dislocation glide and climb is the rate controlling mechanism and hence that p ≈ 0. It is speculated that the large decrease in A with temperature may be the result of an effect on the microstructure.
keyword(s): Deformation , Solder joints , Shear (Mechanics) , Temperature , Stress , Mechanisms , High temperature , Diffusion (Physics) , Creep , Dislocations , Equations , Grain size AND Shear modulus ,
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contributor author | Z. Guo | |
contributor author | Yi-Hsin Pao | |
contributor author | H. Conrad | |
date accessioned | 2017-05-08T23:46:54Z | |
date available | 2017-05-08T23:46:54Z | |
date copyright | June, 1995 | |
date issued | 1995 | |
identifier issn | 1528-9044 | |
identifier other | JEPAE4-26149#100_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/115154 | |
description abstract | The plastic deformation kinetics of 95.5Sn4Cu0.5Ag solder joints were determined in monotonic loading shear over the temperature range of 25°–150°C using three types of tests: (a) constant shear rate, (b) constant shear stress (creep), and (c) differential tests (changes in shear rate or temperature during an otherwise isothermal constant shear rate test). The deformation kinetics were evaluated in terms of the Dorn high temperature plastic deformation equation γ̇p = A(μb/kT) D(b/d)P (τ/μ)n where γ̇p is the shear rate, μ the shear modulus, b the Burgers vector, D the appropriate diffusion coefficient, d the grain size and τ the shear stress. A, p, and n are constants whose values depend on the rate controlling mechanism. It was found that n increased with stress from ~4 at 2 MPa to ~20 at 25 MPa, relatively independent of temperature. The activation ΔH was determined to be 21.1 ± 2 kcal/mole. The constant A, however, decreased with temperature from a value of ~1018 at 25°C to ~1010 at 150°C. The values of n and ΔH suggest that dislocation glide and climb is the rate controlling mechanism and hence that p ≈ 0. It is speculated that the large decrease in A with temperature may be the result of an effect on the microstructure. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Plastic Deformation Kinetics of 95.5Sn4Cu0.5Ag Solder Joints | |
type | Journal Paper | |
journal volume | 117 | |
journal issue | 2 | |
journal title | Journal of Electronic Packaging | |
identifier doi | 10.1115/1.2792074 | |
journal fristpage | 100 | |
journal lastpage | 104 | |
identifier eissn | 1043-7398 | |
keywords | Deformation | |
keywords | Solder joints | |
keywords | Shear (Mechanics) | |
keywords | Temperature | |
keywords | Stress | |
keywords | Mechanisms | |
keywords | High temperature | |
keywords | Diffusion (Physics) | |
keywords | Creep | |
keywords | Dislocations | |
keywords | Equations | |
keywords | Grain size AND Shear modulus | |
tree | Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002 | |
contenttype | Fulltext |