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    Finite Element Viscoelastic Analysis of Temperature and Moisture Effects in Electronic Packaging

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 003::page 192
    Author:
    Arvind Krishna
    ,
    B. D. Harper
    ,
    J. K. Lee
    DOI: 10.1115/1.2792091
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Several workers have demonstrated the presence of singular stress fields near the edge of a bimaterial interface subject to thermal gradients. Many of the analyses in the literature are limited to linear elastic materials and are useful as first estimates of stresses in such assemblies. However, a time-dependent stress analysis is necessary when viscoelastic materials such as polymer films are bonded to elastic substrates. This paper shows the relevance of viscoelastic modeling in demonstrating the effects of combined temperature and moisture loading on bimaterial interfaces and viscoelastic films sandwiched between elastic substrates. A 2-D finite element method for linear hygrothermoviscoelasticity based on an incremental creep strain rate form is developed. The correspondence principle of linear viscoelasticity is invoked and comparisons between FEA and analytical solutions are demonstrated. Moisture is modeled using Fick’s law and the thermorheologically simple material (TSM) postulate is extended to incorporate a moisture shift function in analogy with temperature. The analysis of a polyimide film sandwiched between elastic substrates subject to a thermal cycle with diffusion from the free edge shows stress reversals for the peel stresses that may explain failure modes not anticipated by an elastic analysis.
    keyword(s): Temperature , Electronic packaging , Finite element analysis , Stress , Viscoelasticity , Finite element methods , Stress analysis (Engineering) , Viscoelastic materials , Diffusion (Physics) , Modeling , Cycles , Failure , Polymer films , Elastic analysis , Temperature gradients AND Creep ,
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      Finite Element Viscoelastic Analysis of Temperature and Moisture Effects in Electronic Packaging

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    http://yetl.yabesh.ir/yetl1/handle/yetl/115141
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    contributor authorArvind Krishna
    contributor authorB. D. Harper
    contributor authorJ. K. Lee
    date accessioned2017-05-08T23:46:53Z
    date available2017-05-08T23:46:53Z
    date copyrightSeptember, 1995
    date issued1995
    identifier issn1528-9044
    identifier otherJEPAE4-26150#192_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/115141
    description abstractSeveral workers have demonstrated the presence of singular stress fields near the edge of a bimaterial interface subject to thermal gradients. Many of the analyses in the literature are limited to linear elastic materials and are useful as first estimates of stresses in such assemblies. However, a time-dependent stress analysis is necessary when viscoelastic materials such as polymer films are bonded to elastic substrates. This paper shows the relevance of viscoelastic modeling in demonstrating the effects of combined temperature and moisture loading on bimaterial interfaces and viscoelastic films sandwiched between elastic substrates. A 2-D finite element method for linear hygrothermoviscoelasticity based on an incremental creep strain rate form is developed. The correspondence principle of linear viscoelasticity is invoked and comparisons between FEA and analytical solutions are demonstrated. Moisture is modeled using Fick’s law and the thermorheologically simple material (TSM) postulate is extended to incorporate a moisture shift function in analogy with temperature. The analysis of a polyimide film sandwiched between elastic substrates subject to a thermal cycle with diffusion from the free edge shows stress reversals for the peel stresses that may explain failure modes not anticipated by an elastic analysis.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleFinite Element Viscoelastic Analysis of Temperature and Moisture Effects in Electronic Packaging
    typeJournal Paper
    journal volume117
    journal issue3
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2792091
    journal fristpage192
    journal lastpage200
    identifier eissn1043-7398
    keywordsTemperature
    keywordsElectronic packaging
    keywordsFinite element analysis
    keywordsStress
    keywordsViscoelasticity
    keywordsFinite element methods
    keywordsStress analysis (Engineering)
    keywordsViscoelastic materials
    keywordsDiffusion (Physics)
    keywordsModeling
    keywordsCycles
    keywordsFailure
    keywordsPolymer films
    keywordsElastic analysis
    keywordsTemperature gradients AND Creep
    treeJournal of Electronic Packaging:;1995:;volume( 117 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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