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contributor authorJ. M. Hu
contributor authorD. Barker
contributor authorR. Ghoshtagore
contributor authorM. Pecht
date accessioned2017-05-08T23:43:57Z
date available2017-05-08T23:43:57Z
date copyrightJune, 1994
date issued1994
identifier issn1528-9044
identifier otherJEPAE4-26142#148_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/113450
description abstractThermomechanical properties of low temperature cofired ceramic substrates in the range of operational temperatures are necessary to incorporate into the design models for multichip modules and other electronic packages. These properties are also required in assessing reliability and aiding in screening and qualification procedures. This paper presents the test methods and experimental results on various thermomechanical properties of low temperature cofired ceramic over the the temperature range of −55°C to +250°C. Material properties determined from the tests include the modulus of elasticity, the modulus of rupture, the fracture toughness, and the coefficient of thermal expansion.
publisherThe American Society of Mechanical Engineers (ASME)
titleInvestigation of Thermomechanical Properties of Low Temperature Cofired Ceramic
typeJournal Paper
journal volume116
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905503
journal fristpage148
journal lastpage153
identifier eissn1043-7398
keywordsCeramics
keywordsLow temperature
keywordsTemperature
keywordsThermal expansion
keywordsElasticity
keywordsFracture toughness
keywordsRupture
keywordsElectronic packages
keywordsMulti-chip modules
keywordsReliability
keywordsMaterials properties AND Design
treeJournal of Electronic Packaging:;1994:;volume( 116 ):;issue: 002
contenttypeFulltext


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