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    Physical and Fuzzy Logic Modeling of a Flip-Chip Thermocompression Bonding Process

    Source: Journal of Electronic Packaging:;1993:;volume( 115 ):;issue: 001::page 63
    Author:
    Sa-Yoon Kang
    ,
    H. Xie
    ,
    Y. C. Lee
    DOI: 10.1115/1.2909303
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Flip-Chip connections using gold-to-gold, gold-to-aluminum, or gold-to-solder bondings or contacts enhanced by epoxy are low-cost alternatives to soldering. To assist their technology advancements, we have developed yield models for a representative assembly process with flip-chip, thermocompression bondings. Based on bonding mechanics, a physical yield model has been developed to characterize the process. Then, a fuzzy logic model has been established to improve the modeling’s accuracy by including experimental data. The physical yield model can predict the assembly yield as a function of forces and planarities of the end effector, bump height variations, bump geometries, mechanical properties corresponding to different materials and temperatures, and distribution patterns of bumps. Consistent with our experimental experience, the calculated force level for a high-yield process was around 3000 gmf for a 30-gold-bump chip with a bump diameter of 60 μm and a height of 50 μm. The fuzzy logic model can be trained and adjusted by the results of physical models and experiments. It correlates very well to the nonlinear relationships between the yield and the assembly parameters, and has a self-learning capability to update itself with new data. Such capabilities have been demonstrated by studying the bonding on a substrate with or without a compliant layer.
    keyword(s): Bonding , Fuzzy logic , Modeling , Flip-chip , Manufacturing , Force , Temperature , Aluminum , Solders , Soldering , Epoxy adhesives , Mechanical properties AND End effectors ,
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      Physical and Fuzzy Logic Modeling of a Flip-Chip Thermocompression Bonding Process

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    http://yetl.yabesh.ir/yetl1/handle/yetl/111793
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    contributor authorSa-Yoon Kang
    contributor authorH. Xie
    contributor authorY. C. Lee
    date accessioned2017-05-08T23:41:04Z
    date available2017-05-08T23:41:04Z
    date copyrightMarch, 1993
    date issued1993
    identifier issn1528-9044
    identifier otherJEPAE4-26135#63_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/111793
    description abstractFlip-Chip connections using gold-to-gold, gold-to-aluminum, or gold-to-solder bondings or contacts enhanced by epoxy are low-cost alternatives to soldering. To assist their technology advancements, we have developed yield models for a representative assembly process with flip-chip, thermocompression bondings. Based on bonding mechanics, a physical yield model has been developed to characterize the process. Then, a fuzzy logic model has been established to improve the modeling’s accuracy by including experimental data. The physical yield model can predict the assembly yield as a function of forces and planarities of the end effector, bump height variations, bump geometries, mechanical properties corresponding to different materials and temperatures, and distribution patterns of bumps. Consistent with our experimental experience, the calculated force level for a high-yield process was around 3000 gmf for a 30-gold-bump chip with a bump diameter of 60 μm and a height of 50 μm. The fuzzy logic model can be trained and adjusted by the results of physical models and experiments. It correlates very well to the nonlinear relationships between the yield and the assembly parameters, and has a self-learning capability to update itself with new data. Such capabilities have been demonstrated by studying the bonding on a substrate with or without a compliant layer.
    publisherThe American Society of Mechanical Engineers (ASME)
    titlePhysical and Fuzzy Logic Modeling of a Flip-Chip Thermocompression Bonding Process
    typeJournal Paper
    journal volume115
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2909303
    journal fristpage63
    journal lastpage70
    identifier eissn1043-7398
    keywordsBonding
    keywordsFuzzy logic
    keywordsModeling
    keywordsFlip-chip
    keywordsManufacturing
    keywordsForce
    keywordsTemperature
    keywordsAluminum
    keywordsSolders
    keywordsSoldering
    keywordsEpoxy adhesives
    keywordsMechanical properties AND End effectors
    treeJournal of Electronic Packaging:;1993:;volume( 115 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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