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    Thermal Effects During Infrared Solder Reflow—Part II: A Model of the Reflow Process

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 001::page 48
    Author:
    M. Eftychiou
    ,
    T. L. Bergman
    ,
    G. Y. Masada
    DOI: 10.1115/1.2905441
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A numerical model is developed that describes the infrared reflow soldering of surface mounted components onto prewired circuit cards. The model predicts convective conditions within the reflow oven and uses these conditions, in conjunction with a radiative heat transfer analysis and a two-dimensional transient conduction analysis, to predict the thermal response of a card assembly as its components are soldered. The model is described, and its performance is illustrated through presentation of base case simulations. Parametric simulations are performed to determine the sensitivity of the card assembly thermal response to variations in oven conditions and uncertainties in the convective, as well as radiative heat transfer portions of the model.
    keyword(s): Temperature effects , Reflow soldering , Ovens , Engineering simulation , Radiative heat transfer , Manufacturing , Heat conduction , Computer simulation AND Circuits ,
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      Thermal Effects During Infrared Solder Reflow—Part II: A Model of the Reflow Process

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/110095
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    • Journal of Electronic Packaging

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    contributor authorM. Eftychiou
    contributor authorT. L. Bergman
    contributor authorG. Y. Masada
    date accessioned2017-05-08T23:38:09Z
    date available2017-05-08T23:38:09Z
    date copyrightMarch, 1992
    date issued1992
    identifier issn1528-9044
    identifier otherJEPAE4-26127#48_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110095
    description abstractA numerical model is developed that describes the infrared reflow soldering of surface mounted components onto prewired circuit cards. The model predicts convective conditions within the reflow oven and uses these conditions, in conjunction with a radiative heat transfer analysis and a two-dimensional transient conduction analysis, to predict the thermal response of a card assembly as its components are soldered. The model is described, and its performance is illustrated through presentation of base case simulations. Parametric simulations are performed to determine the sensitivity of the card assembly thermal response to variations in oven conditions and uncertainties in the convective, as well as radiative heat transfer portions of the model.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermal Effects During Infrared Solder Reflow—Part II: A Model of the Reflow Process
    typeJournal Paper
    journal volume114
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2905441
    journal fristpage48
    journal lastpage54
    identifier eissn1043-7398
    keywordsTemperature effects
    keywordsReflow soldering
    keywordsOvens
    keywordsEngineering simulation
    keywordsRadiative heat transfer
    keywordsManufacturing
    keywordsHeat conduction
    keywordsComputer simulation AND Circuits
    treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian